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Articles by author: J. Jiménez

• Annealing-Related Phenomena in Bulk Semi-Insulating Indium Phosphide
  Published in: Diffusion in GaAs and other III-V Semiconductors (p103)
• Creep Transients in Yba₂Cu₃O_7-x Superconductors
  Published in: Defects in Insulating Materials (p439)
• Homogeneity of Fe-Doped InP Wafers Using Optical Microprobes
  Published in: Defects in Semiconductors 19 (p825)
• Low Temperature ECR-PECVD Microcrystalline SiC Growth by Pulsed Gas Flows
  Published in: Silicon Carbide and Related Materials 2003 (p309)
• MicroRaman and Hall Effect Study of n-Type Bulk 4H-SiC
  Published in: Silicon Carbide and Related Materials - 1999 (p707)
• On the Defect Structures in Te-Doped GaAs
  Published in: Gettering and Defect Engineering in Semiconductor Technology VII (p425)
• Study of the Dislocation Atmospheres in N-Type GaAs by DSL Photoetching, EBIC and Microraman Measurements
  Published in: Defects in Semiconductors 18 (p1791)