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Articles by author: Matteo Leoni

• A Computer Program for Structural Refinement from Thin Film XRD Patterns
  Published in: European Powder Diffraction 5 (p177)
• Domain Size Analysis in the Rietveld Method
  Published in: Extending the Reach of Powder Diffraction Modelling (p187)
• Elastic Behaviour of Thin Stabilized-Zirconia Coatings
  Published in: European Powder Diffraction EPDIC 8 (p77)
• Elastic Constants of LPPS Stabilized-Zirconia Coatings
  Published in: Residual Stresses VI, ECRS6 (p431)
• Full Pattern Methods for the Analysis of Plastically Deformed Materials
  Published in: APPLIED CRYSTALLOGRAPHY XX (p27)
• Grain Surface Relaxation and Grain Interaction in Powder Diffraction
  Published in: European Powder Diffraction EPDIC 8 (p1)
• Kinetics of Ag Distribution in High Lead Glass by Real Time Synchrotron Powder Diffraction
  Published in: European Powder Diffraction 6 (p1051)
• Line Profile Analysis in the Rietveld Method and Whole-Powder-Pattern Fitting
  Published in: European Powder Diffraction EPDIC 7 (p132)
• Microstructure and Phase Morphology of Diamond Thin Films by Synchrotron Radiation X-Ray Diffraction
  Published in: Advances in Crystal Growth (p285)
• Multicapillary Optics for Materials Science Studies
  Published in: European Powder Diffraction 6 (p162)
• On Faulting in Nanocrystallites of FCC Metals
  Published in: Residual Stresses VIII (p13)
• On the Modelling of Diffraction Line Profiles from Nanocrystalline Materials
  Published in: Applied Crystallography XXI (p19)
• Residual Stress in Diamond Coatings by Synchrotron Radiation XRD
  Published in: European Powder Diffraction 4 (p451)
• Standard Reference Materials for the Measurement of Instrument Resolution Functions: Effect of Transparency
  Published in: European Powder Diffraction 5 (p278)
• Strain-Texture Correlation in r.f. Magnetron Sputtered Thin Films
  Published in: European Powder Diffraction 6 (p439)