Authors: Guan Fu Lin, Ming Yi Tsai, Chiu Yuan Chen
Abstract: This paper presents a combined diamond-impregnated lapping plate for single crystal silicon carbide (SiC) to improve the material removal rate due to SiC having very low material removal rate. Three different dimaond shapes were prepared: (1) "sharp," a sharp-edged diamod; (2) "blocky," a high quality crystalline diamond; (3) "oxidized diamond". The diamonds were manufactured by using high temperature heating method in a furnace to induce diamond oxidation resulting in improvement of Ra and sharpness of the diamonds. Three combined diamond-impregnated lapping plates were fabricated using the above mentioned diamond shapes with diamond size of 6μm. The surface roughness and removal rate of the SiC lapping with these plate were investigated. Experimental results showed that the average material removal rate (MRR) of oxidized diamond is higher than that of the other diamond shapes. The MRR of oxidized diamond for C-face and Si-face SiC are 4.72μm/hr and 6.26μm/hr, respectively. It is found that the surface roughness (Ra) of oxidized diamond for C-face and Si-face are 7.547nm and 8.06nm, respectively. This indicates that the combined diamond-impregnated lapping plate can be effectively used for SiC machining.
157
Authors: Ming Yi Tsai, Alan Chen, Hung Jui Chang
Abstract: The wear behaviors of micrographite particles impregnating a cubic boron nitride (CBN) abrasive matrix using resin bonding was presented. CBN composite specimens containing 0.1, 1, and 5 wt% graphite and 50, 75, and 100 CBN concentrations were prepared by compression molding. Three dressing materials—copper, SiC, and Al2O3—were prepared to dress the CBN composite specimens. A carrier was designed and manufactured have a shape similar to that of a grinding wheel in order to hold the CBN composite specimens, which was then attached to the spindle of the grinder to carry out the grinding processes. The worn surfaces of the CBN composites were examined using scanning electron microscopy. Also, the surface characteristics and wear rate of the CBN composite specimens, the material removal rate, and the surface roughness of the SKD11 steel were investigated under dry grinding conditions. The experimental results indicated that there was considerable improvement in the process performance of the graphite-impregnated CBN structure.
18
Authors: Ming Yi Tsai, J.K. Ho, Jyu Lin Zeng
Abstract: This paper presents a combined diamond disk that is designed and manufactured to markedly improve the leveling of diamond tips, thereby reducing the amount of diamond grit. First, a small brazed diamond disk was manufactured. Second, 12-or 24-disk brazed diamond disks were mounted onto a substrate with a diameter of 108 mm for completing the combined diamond disk. Four types of disks were fabricated, and their performances were compared with that of a conventional diamond disk. The experimental results showed that the combined diamond disk has more complete diamond crystal shapes and distribution with better leveling, which increases the effectiveness of the working diamond grits. Compared to a conventional diamond disk, the combined diamond disk achieved a higher wafer removal rate and better uniformity while consuming less pad material. The number of diamond grits required was significantly lower. Roughly, 7,600 and 12,000 diamond grits were used for the 24-and 12-disk brazed diamond disks, respectively, in the new disk, whereas 20,000 diamond grits were used in a conventional diamond disk. In the case of the conventional diamond disk, the diamond tips are leveled to more than 50 μm. However, in the case of the combined diamond disk, the diamond tips can be leveled to less than 30 μm because the diamond tips are already leveled. These results contribute to the understanding of conditioning techniques and further improvement of the chemical mechanical polishing process.
110
Authors: Ming Yi Tsai, Shi Xing Jian, J. H. Chiang
Abstract: Grinding, a technique for removing abrasive materials, is a chip-removal process that uses an individual abrasive grain as the cutting tool. Abrasive material removal processes can be very challenging owing to the high power requirements and the resulting high temperatures, especially at the workpiece-wheel interface. This paper presents a novel system that uses graphite particles impregnated in an aluminum oxide matrix to form a grinding wheel. This study specifically investigated grinding wheels with a graphite content of 0.5 wt%. The new grinding wheel was compared with conventional grinding wheels by comparing the factors of grinding performance, such as surface roughness, morphology, wheel wear ratio, grinding temperature, and grinding forces, when the wheels were used under two different coolant strategiesdry and with minimum quantity lubrication (MQL) using pure water. This study found that there is a considerable improvement in the grinding performance using graphite-impregnated grinding wheels over the performance obtained using conventional grinding wheels. The use of 0.5 wt% graphite provided better surface roughness and topography, lower grinding temperature, and decreased force; in addition, wheel consumption was lower, resulting in extended wheel life.
3302
Authors: Ming Yi Tsai, W.K. Chen, Hung Jung Tsai
Abstract: A pad conditioner or diamond disk is needed to regenerate the asperity structure of the pad and recover its designated role in the chemical mechanical polishing process. In this paper, the effect of dressing load and speed on removal rate of oxidized wafers were investigated using a polycrystalline diamond disk and brazed diamond disk. It was found that polycrystalline diamond disk enable the manufacturer to tightly control diamond leveling and the cutter’s shape by comparison with a brazed diamond disk that contains discrete diamond grits of random orientation. Experimental results revealed that for polycrystalline diamond disk, the removal rate of oxidized wafer displayed an almost unchanged curve when the load was less than 4kg, but the removal rate of oxidized wafer for brazed diamond disk initially increased with the dressing load, reaching a maximum value at a dressing load of approximately 4 kg. Then, it decreased slowly with further increases of the dressing load. The removal rate of oxidized wafer remains unchanged with dressing speed.
832
Authors: Hung Jung Tsai, Pay Yau Huang, Ming Yi Tsai, Hung Cheng Tsai, Cin Jhe Lin
Abstract: In the current study, a high precision polishing process test bench with in-situ measurement technology was developed. The test bench also adopted to investigate the effects of operating parameters on polishing interfacial phenomena during the polishing process with IC1000 pad. The experimental results coincide with the experimental and theoretical data published previously results. The developed test rig and the current experimental outcomes contribute to the understanding of soft pad polishing mechanism.
508
Authors: James C. Sung, Ming Yi Tsai, Cheng Shiang Chou, Pei Lum Tso, Ying Tung Chen
Abstract: Due to the continual improvement of CMP technologies, and the need for polishing delicate
wafers at high speed, graphite impregnated pads (GiP) dressed by brazed organic dia mond disks
(BODD) can double the throughput of wafer-pass at the reduced cost of ownership (CoO). The
increased polishing rate is due to the act of nano graphite particles that absorb slurry. The nano
graphite particles coated with chemical and abrasive can achieve high removal rate without causing
scratches on the wafer. In addition, nano graphite particles do not stick to wafer surfaces, so they can
be cleaned easily. BODD can uniquely dress GiP to create slurry channels so the pore free pad is not
bottlenecked by slurry supply. This paper also demonstrated the low stress polishing by applying
ultrasound during the CMP process.
1013
Authors: Shenq Yih Luo, J.K. Ho, Ming Yi Tsai, Yi Xian Liu, William Chen
Abstract: The purpose of this paper was to investigate the grinding performance of two types of cobalt and vitrified bond diamond tools produced by the hot press for the vertical flat grinding polycrystalline diamond. The worn diamond type and the diamond protrusion observed by the toolmaker or SEM after grinding under two different feed rates of 1 and 5 mm/min and the depth of cut of 2 µm with total depth of 10µm were studied. In addition, the grinding efficiency and the workpiece surface roughness produced were analyzed as well. The experiment results showed that when the feed rate of 1 mm/min during the flat grinding PCD was used, a lower percentage of the good diamond, a higher percentage of flat diamond and pulled-out hole on the worn surface of the cobalt bond diamond tool were obtained. For the vitrified bond diamond tool, the good diamond produced showed a higher percentage and flat grit and pulled-out hole displayed a relatively lower percentage. This may be due to the result of the relatively moderate strength and grit retention of the vitrified bond. Furthermore, the diamond protrusion and the grinding efficiency produced for the vitrified bond diamond tool were better than those for the cobalt bond tool. And the PCD surface roughness obtained was better as well.
585
Authors: Ming Yi Tsai, W.Z. Yang
Abstract: The friction phenomenon was investigated to explore the relationship between the diamond conditioner, polishing pad and wafer of oxide film in the chemical mechanical polishing (CMP) process. Two kinds of diamond conditioners (disk-A and disk-B) were used. Diamond disk-A used was traditional diamond conditioner containing random shaped diamond grits. Diamond disk-B used was made by sculpturing a sintered polycrystalline diamond to form identically shaped cutting tips. Experimental results reveal that friction force between disk and pad increases with dressing load. But friction force decreases with sliding speed due to increase of sliding speeds resulting in an increase of interface temperature. The coefficient of friction between wafer and pad initially increases with the dressing load, and then it starts to drop slowly with further increases of the dressing load. It was found that removal rate of the oxide film correlates well with the variation of the coefficient of force. In addition disk-B can produce a higher wafer removal rate under a low dressing load.
320
Abstract: A diamond conditioner or dresser is needed to regenerate the asperity structure of the pad and recover its designed ability in chemical mechanical polishing (CMP) process. In this paper a new design of diamond conditioner is made by shaping a sintered matrix of polycrystalline diamond (PCD) to form teethed blades. These blades are arranged and embedded in epoxy resin to make a designed penetration angle, called the blade diamond disk. The dressing characteristics of pad surface textures are studied by comparison with conventional diamond conditioner. It is found that the height variation of the diamond tip of blade diamond disk is significantly smaller than the conventional diamond disk. The dressing rate of blade diamond disk is lower than that of the conventional diamond disk, and hence the pad life is prolonged. As a result, reduction of the cost CMP is expected. In addition the pad surface roughness Ra of about 3.79μm is less than Ra of about 4.15μm obtained after dressing using a conventional diamond disk.
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