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Articles by author: P. Pirouz

• 4H- to 3C-SiC Polytypic Transformation during Oxidation
  Published in: Silicon Carbide and Related Materials 2001 (p451)
• A Comparison of SiO₂ and Si₃N₄ Masks for Selective Epitaxial Growth of 3C-SiC Films on Si
  Published in: Silicon Carbide and Related Materials 2000 (p171)
• Absence of Dislocation Motion in 3C-SiC pn Diodes under Forward Bias
  Published in: Silicon Carbide and Related Materials 2006 (p223)
• Basal Twinning in Sapphire (α-Al₂O₃)
  Published in: Dislocations '93 (p607)
• Comparison of Mechanical and Chemomechanical Polished SiC Wafers Using Photon Backscattering
  Published in: Silicon Carbide and Related Materials - 1999 (p841)
• Defect Characterization in 3C-SiC Films Grown on Thin and Thick Silicon Top Layers of SIMOX
  Published in: Silicon Carbide and Related Materials - 1999 (p525)
• Deformation of 4H-SiC Single Crystals Oriented for Prism Slip
  Published in: Silicon Carbide and Related Materials 2003 (p371)
• Deformation of Monocrystalline 6H-SiC
  Published in: Silicon Carbide, III-Nitrides and Related Materials (p627)
• Deformation Tests on 4H-SiC Single Crystals between 900°C and 1360°C and the Microstructure of the Deformed Samples
  Published in: Silicon Carbide and Related Materials - 1999 (p517)
• Dislocations and Polytypic Phase Transformations
  Published in: Dislocations '93 (p183)
• Extended Defects in SiC and GaN Semiconductors
  Published in: Silicon Carbide, III-Nitrides and Related Materials (p399)
• Generation of Stacking Faults in Highly Doped n-Type 4H-SiC Substrates
  Published in: Silicon Carbide and Related Materials 2003 (p759)
• In Situ Studies of Structural Instability in Operating 4H-SiC PiN Diodes
  Published in: Silicon Carbide and Related Materials - 2002 (p933)
• Investigation of Stacking Fault Formation in Hydrogen Bombarded 4H-SiC
  Published in: Silicon Carbide and Related Materials 2004 (p327)
• Investigation of Structural Stability in 4H-SiC Structures with Heavy Ion Implanted Interface
  Published in: Silicon Carbide and Related Materials 2005 (p395)