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Articles by author: Peter Mascher

• Positron Annihilation in Electron Irradiated Silicon
  Published in: Defects in Semiconductors 15 (p1157)
• Shallow Positron Traps in Gallium Arsenide
  Published in: Defects in Semiconductors 15 (p893)
• Studies of Defects in Electron and Proton Irradiated ZnO by Positron Annihilation
  Published in: Defects in Semiconductors 18 (p333)
• The Influence of the Zinc Concentration on Defect Characteristics of InP
  Published in: Defects in Semiconductors 18 (p1661)
• Vacancy Type Defects in Proton Irradiated SiC
  Published in: Materials Science Applications of Ion Beam Techniques (p285)
• Vacancy-Type Defects in Electron and Proton Irradiated II-VI Compounds
  Published in: Defects in Semiconductors 19 (p1419)
• Vacancy-Type Defects in Electron and Proton Irradiated ZnS and ZnTe
  Published in: Positron Annihilation - ICPA-11 (p503)
• Vacancy-Type Defects in Proton-Irradiated 6H- and 4H-SiC: A Systematic Study with Positron Annihilation Techniques
  Published in: Silicon Carbide and Related Materials - 1999 (p969)
• Vacancy-Type Defects in Proton-Irradiated SiC
  Published in: Defects in Semiconductors 19 (p733)