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Articles by author: Robert Jérisian

• Development of Sol-Gel MgO Thin Films for SiC Insulation Applications
  Published in: Silicon Carbide and Related Materials 2003 (p1373)
• Dopant Segregation on Cavities Induced by Helium Implantation: The Case of Boron and Phosphorus
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p309)
• Doping Effect of Helium Induced Nanocavities in Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p325)
• Impact of Hydrogen Implantation on Helium Implantation Induced Defects
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p309)
• Physical Properties of Polysilicon Diodes Derived from a Smart Power Technology
  Published in: Polycrystalline Semiconductors IV (p567)
• Properties of Cavities Induced by Helium Implantation in Silicon and their Applications to Devices
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p297)