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CONFERENCE
6/16/2013 - 6/19/2013
The 7th International conference on Physical and Numerical Simulation of Materials Processing
5/16/2013 - 5/19/2013
2nd International Congress on Advanced Materials
4/13/2013 - 4/14/2013
2013 2nd lnternational Conference on lntclligent Materials, Applied Mechanics and Design Science (IMAMD 2013)
more...
Articles by author: Roberto S. Brusa
16 papers on 2 pages:
1
[2]
[next]
Comparative Study of Porosity in Low-k SiOCH Thin Films Obtained at Different Deposition Conditions
Published in:
Positron Annihilation - ICPA-13
(p268)
Defect Studies in Fe
3
Al Alloys Doped with Cr, Mo and Si
Published in:
Positron Annihilation - ICPA-12
(p195)
Evolution of Defect Profiles in He-Implanted Silicon Studied by Slow Positrons
Published in:
Positron Annihilation - ICPA-11
(p665)
Improvements in the Acquisition and Analysis of Doppler-Broadening Annihilation Spectra
Published in:
Positron Annihilation - ICPA-9
(p1853)
Influence of Mn and Fe on Defects in NiAl Alloy Investigated by Positron Annihilation Techniques
Published in:
Positron Annihilation - ICPA-12
(p198)
Near-Surface Studies on Low-Energy Ion Irradiated Ni Using a Positron Beam
Published in:
Advanced Materials Forum II
(p623)
Positron Annihilation Studies of Oxygen Precipitation in Silicon and of Nano-Precipitates in Si-Rich SiO
2
Films: Role of Vacancy-Like Defects
Published in:
Gettering anf Defect Engineering in Semiconductor Technology IX
(p81)
Positron Mobility in Polyethylene
Published in:
Positron Annihilation - ICPA-10
(p655)
Pre-Cavities Defect Distribution in He Implanted Silicon Studied by Slow Positron Beam
Published in:
Gettering and Defect Engineering in Semiconductor Technology VIII
(p385)
Spherical Symmetry Brightness Enhancer for Accelerator and Reactor-Based Positron Beams
Published in:
Positron Annihilation - ICPA-9
(p2021)
Spin States of Positron Compounds
Published in:
Positron Annihilation - ICPA-9
(p197)
Sub-Surface Defects Induced by Low Energy Ar
+
Sputtering of Silver
Published in:
Advanced Materials Forum III
(p1608)
Surfaces of SiO
2
-Bi
2
O
3
Glasses Studied by a Slow Positron Beam
Published in:
Positron Annihilation - ICPA-12
(p466)
Thermal Evolution of Defect Profiles in H-Implanted Silicon Studied by Slow Positrons
Published in:
Positron Annihilation - ICPA-9
(p1367)
Thermal Evolution of Defects in H-Implanted Silicon Investigated by Slow Positrons
Published in:
Positron Annihilation - ICPA-10
(p141)
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