Papers by Author: S. Frabboni

Paper TitlePage

Strain Characterisation at the nm Scale of Deep Sub-Micron Devices by Convergent-Beam Electron Diffraction
Authors: Aldo Armigliato, R. Balboni, A. Benedetti, G.P. Carnevale, A.G. Cullis, S. Frabboni, D. Piccolo
727
Vacancy-Gettering in Silicon: Cavities and Helium-Implantation
Authors: F. Corni, R. Tonini, S. Frabboni, C. Nobili, G. Calzolari, S. Masetti, P. Tamarozzi, Giuseppe Pavia, G.F. Cerofolini
229
Strain in Silicon below Si3N4 Stripes, Comparison between SUPREM IV Calculation and TEM/CBED Measurements
Authors: Aldo Armigliato, R. Balboni, S. Frabboni, A. Tixier, G.P. Carnevale, P. Colpani, A. Marmiroli
365
Investigation of Strain in Si1-xGex/Si Heterostructures and Local Isolation Structures by Convergent Beam Electron Diffraction
Authors: Aldo Armigliato, R. Balboni, S. Frabboni, Jan Vanhellemont
547
Showing 1 to 4 of 4 Paper Titles