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Articles by author: Seiichi Miyazaki

• Characterization of Electronic Charged States of Nickel Silicide Nanodots Using AFM/ Kelvin Probe Technique
  Published in: PRICM 6 (p1213)
• Formation of High Density Metal Silicide Nanodots on Ultrathin SiO₂ for Floating Gate Memory Application
  Published in: THERMEC 2009 (p1725)
• Formation of Metal Silicide Nanodots on Ultrathin SiO₂ for Floating Gate Application
  Published in: Smart Materials for Smart Devices and Structures (p95)
• High Rate Growth of Highly-Crystallized Ge Films on Quartz from VHF Inductively-Coupled Plasma of GeH₄ + H₂
  Published in: PRICM 6 (p1209)
• Influence of Boron and Fluorine Incorporation on the Network Structure of Ultrathin SiO₂
  Published in: Ultra Clean Processing of Silicon Surfaces V (p149)
• Light Emitting Diode with MOS Structures Containing Multiple-Stacked Si Quantum Dots
  Published in: Nanoscience and Technology (p557)
• The Influence of Defects and Impurities on Electrical Properties of High-k Dielectrics
  Published in: Advances in Electronic Materials (p55)