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Articles by author: Shigeru Kimura

• Analysis of Minute StrainFields around Microdefects in Silicion Crystals by Plane-Wave X-Ray Topography
  Published in: Defect and Diffusion Forum Vols. 138-139 (p49)
• Application Studies of New Process and Material for Low-Cost SPF/DB Panel Forming Technology
  Published in: Superplasticity in Advanced Materials - ICSAM 2003 (p277)
• Fracture Behavior and Its Shear Lag – Monte Carlo Simulation of SiC/SiC Composite Exposed in Air at High Temperatures
  Published in: PRICM-5 (p1101)
• Microscopic Structure of Directly Bonded Silicon Substrates
  Published in: Technology Evolution for Silicon Nano-Electronics (p164)
• Microwave Plasma Oxidation of Silicon
  Published in: Plasma Properties, Deposition and Etching (p583)
• Nanometer-Scale Characterization Technique for Si Nanoelectric Materials Using Synchrotron Radiation Microdiffraction
  Published in: Technology Evolution for Silicon Nano-Electronics (p104)
• Relation between Minute Lattice Strain and Anomalous Oxygen Precipitation in a Czochralski-Grown Silicon Crystal
  Published in: Defects in Semiconductors 18 (p1743)
• Structural Change during the Formation of Directly Bonded Silicon Substrates
  Published in: Technology Evolution for Silicon Nano-Electronics (p158)