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Articles by author: Shunichi Hishita

• Beryllium Implantation Doping of Silicon Carbide
  Published in: Silicon Carbide and Related Materials - 1999 (p953)
• Defect Structure in (Zn,Mg)O Films Prepared on YSZ Substrate
  Published in: Electroceramics in Japan IX (p103)
• Electrical Properties and Characterization of In₂O₃(ZnO)_m Thin Films
  Published in: Asian Ceramic Science for Electronics I (p199)
• Formation of SiC Thin Films by Ion Beam Irradiation
  Published in: Electroceramics in Japan II (p179)
• Impact of Two-Step Growth upon In₂O₃(ZnO)₅ Film Quality
  Published in: Asian Ceramic Science for Electronics II and Electroceramics in Japan V (p167)
• Impurity Contamination and Diffusion during Annealing in Implanted ZnO
  Published in: Electroceramics in Japan XI (p23)
• Interfacial Energy State of Grain Boundaries in Some Electronic Ceramics
  Published in: Intergranular and Interphase Boundaries in Materials (p741)
• Metastable Defects in Oxide Thin Films
  Published in: Electroceramics in Japan II (p155)
• Microstructure of Zinc Oxide Grown by rf Magnetron Sputtering: Aspect of Oxygen Vacancy
  Published in: Electroceramics in Japan III (p101)
• Oxygen Diffusion in Zinc Oxide Single Crystals
  Published in: Electroceramics in Japan I (p221)
• Relationship between Aluminum and Lithium and Annealing for Reducing Lithium Contamination in Aluminum-Implanted Zinc Oxide
  Published in: Electroceramics in Japan XIII (p205)