Authors: Isao Sakaguchi, Sakyo Hirose, Tomohiro Furuta, Ken Watanabe, Keisuke Kageyama, Shunichi Hishita, Hajime Haneda, Naoki Ohashi
Abstract: The effect of the surface preparation in samarium doped semiconducting barium titanate [(Ba1-xSmx)TiO3] ceramics with (Ba, Sm)/Ti ratio of 1.000 was studied by means of isotope tracer technique using a secondary ion mass spectrometer. The surfaces of specimens were prepared with the chemical mechanical polishing (CMP) with colloidal silica slurry or the mechanical polishing (MP) with diamond paste. The oxygen diffusion coefficients obtained in the CMP samples were small compared to those in the mechanical polished samples. This fact suggests that the surface prepared with CMP has less oxygen defect concentration. Moreover, it was also indicated that high temperature treatment over 1000 °C is required for annihilation of defects formed by MP. The oxygen diffusion study used CMP sample brings the useful information on the oxygen defect chemistry in Sm doped BaTiO3.
189
Authors: Isao Sakaguchi, Ken Watanabe, Yutaka Adachi, Takeshi Ohgaki, Shunichi Hishita, Naoki Ohashi, Hajime Haneda
Abstract: The a-axis oriented ZnO thin films deposited on sapphire substrates by pulsed laser deposition were studied to investigate the effects of pre-annealing on oxygen diffusion. The effect was as follows: the oxygen diffusion coefficient decreased, and the oxygen concentration in the tailing regions of the profiles reduced. Ion images of an oxygen tracer revealed the high-diffusivity paths for oxygen tracer diffusion. The temperature dependence of oxygen tracer diffusion coefficients (Db) in as-deposited and pre-annealed thin films were determined to be Db [cm2/ = 9.2x102 exp (- 405 [kJ/mo / RT) and Db [cm2/ = 1.8x103 exp (- 418 [kJ/mo / RT), respectively. On basis of these results, the crystal orientation on Db and the mechanism for oxygen diffusion were discussed.
266
Authors: Isao Sakaguchi, Kenji Matsumoto, Takeshi Ohgaki, Shunichi Hishita, Yutaka Adachi, Tsubasa Nakagawa, Ken Watanabe, Naoki Ohashi, Hajime Haneda
Abstract: The relationship between Al and Li during diffusion was studied using Al-implanted ZnO. The Al donor in ZnO acts to increase the concentration of Li contamination from the atmosphere during the annealing. It is difficult to decompose the relationship formed by diffusion between Al and Li during high-temperature annealing. The most effective method to decompose the relationship is to anneal the as-implanted ZnO at a pressure of 5×10-3 torr. This annealing increases the Al solubility limit because the ZnO surface evaporates.
205
Authors: Isao Sakaguchi, Yutaka Adachi, Takeshi Ogaki, Kenji Matsumoto, Shunichi Hishita, Hajime Haneda, Naoki Ohashi
Abstract: The effect of ion implantation leading to contamination and diffusion of lithium
impurity in ZnO ceramics substrates was investigated. The diffusion coefficients of Li in the
implanted ZnO annealed at 1000 and 850°C were in good agreement with those in the
non-implanted ZnO. At 700°C, Li diffusion in the implanted ZnO was strongly enhanced. Our
results show that the defects introduced by the implantation enhance the impurity diffusion at
low temperature annealing.
23
Authors: Haruki Ryoken, Isao Sakaguchi, Naoki Ohashi, Yutaka Adachi, Takeshi Ohgaki, Shunichi Hishita, Hajime Haneda
Abstract: The defect structure of undoped ZnO and (Zn1-x,Mgx)O solid-solution films were deposited on
YSZ substrate with pulsed laser deposition (PLD) to investigate defect equilibria in those films. In
particular, the effects of thermal treatment on the structures and prosperities of (Zn1-x,Mgx)O
solid-solution films were examined. The films with high MgO concentration (x>0.12) decomposed
to the wurtzite-type and rock-salt-type phase after thermal treatment, indicating that the solubility
limit of Mg was about x=0.12 and the wurtzite-type (Zn,Mg)O films with x>0.12 were indicated to
be non-equilibrium ones. The subsequent analyses of oxygen diffusivity in those films revealed that
the films under non-equilibrium state, i.e., wurtzite-type (Zn1-x,Mgx)O with x>0.12, contained
significantly high concentration of anion defects.
103
Authors: Tsuyoshi Ogino, Naoki Ohashi, Isao Sakaguchi, Shunichi Hishita, Yutaka Adachi, Hajime Haneda
167
Authors: Tsuyoshi Ogino, Mamabu Komatsu, Naoki Ohashi, Isao Sakaguchi, Shunichi Hishita, Tadashi Takenaka, Hajime Haneda
199
Authors: Tsuyoshi Ogino, Mamabu Komatsu, Isao Sakaguchi, Shunichi Hishita, Naoki Ohashi, Tadashi Takenaka, Kensuke Oki, Noriyuki Kuwano, Hajime Haneda
101
Authors: T. Henkel, Yasuhito Tanaka, Naoto Kobayashi, Shin Ichi Nishizawa, Shunichi Hishita
953
Authors: Shunichi Hishita, K. Oyoshi, S. Suehara, Tatsuhiko Aizawa
179