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CONFERENCE
12/9/2012 - 12/12/2012
ACAM7: The 7th Australasian Congress on Applied Mechanics
11/16/2012 - 11/18/2012
2nd International Conference on Manufacturing Engineering and Automation (ICMEA2012)
11/16/2012 - 11/18/2012
more...
Articles by author: Sven Öberg
50 papers on 4 pages:
1
[2]
[3]
[4]
[next]
A First Principles Study of Interstitial Si in Diamond
Published in:
Defects in Semiconductors 19
(p781)
A Theoretical Study of Copper Contaminated Dislocations in Silicon
Published in:
Gettering and Defect Engineering in Semiconductor Technology XII
(p259)
Ab Initio Calculations on Interstitial O Clusters in Si
Published in:
Shallow Impurities in Semiconductors IV
(p287)
An Ab Initio Study of Intrinsic Stacking Faults in GaN
Published in:
Silicon Carbide and Related Materials 2003
(p1617)
Anomalous Shift of the 1075 cm
-1
Oxygen-Hydrogen Defect in Silicon
Published in:
Defects in Semiconductors 19
(p277)
Breakdown of the Vacancy Model for Impurity-Vacancy Defects in Diamond
Published in:
Defects in Semiconductors 19
(p775)
Density Functional Based Modelling of 30° Partial Dislocations in SiC
Published in:
Silicon Carbide and Related Materials 2003
(p453)
Dislocation Structures in Diamond: Density-Functional Based Modelling and High-Resolution Electron Microscopy
Published in:
Defects and Diffusion in Ceramics
(p11)
Effective Mass of Electrons in Quantum-Well-Like Stacking-Fault Gap States in Silicon Carbide
Published in:
Silicon Carbide and Related Materials - 2002
(p519)
Electronic Localization around Stacking Faults in Silicon Carbide
Published in:
Silicon Carbide and Related Materials 2001
(p529)
Electronic Properties and Structure of a Complex Incorporating a Self-Interstitial and two Oxygen Atoms in Silicon
Published in:
Gettering and Defect Engineering in Semiconductor Technology XI
(p273)
Electronic Properties of Stacking Faults in 15R-SiC
Published in:
Silicon Carbide and Related Materials - 2002
(p531)
Electronic Structure of Twin Boundaries in 3C-SiC, Si and Diamond
Published in:
Silicon Carbide and Related Materials - 2002
(p527)
First Principles Investigation of Vacancy Oxygen Defects in Si
Published in:
Defects in Semiconductors 18
(p1297)
H Interacting with Intrinsic Defects in Si
Published in:
Defects in Semiconductors 18
(p933)
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