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Articles by author: W. Henrion

• Determination of Subgap-Asorption in μc-Si:H Films by CPM
  Published in: Gettering and Defect Engineering in Semiconductor Technology VI (p607)
• Effect of Preparation-Induced Surface Morphology on the Stability of H-Terminated Si(111) and Si(100) Surfaces
  Published in: Ultra Clean Processing of Silicon Surfaces VI (p179)
• Electronic Properties of Wet-Chemically Prepared Oxide Layers
  Published in: Ultra Clean Processing of Silicon Surfaces V (p181)
• Excimer Laser Crystallization of Doped and Undoped a-Si:H for Solar Cells
  Published in: Polycrystalline Semiconductors VI (p181)
• Low-Temperature Deposition of Microcrystalline Silicon by Microwave Plasma-Enhanced Sputtering
  Published in: Polycrystalline Semiconductors V (p119)
• Optical and Electrical Properties of Iron Disilicide with Different Degree of Structural Perfection
  Published in: Polycrystalline Semiconductors IV (p341)
• Optical and Photoelectrical Properties of Microcrystalline Silicon Layers in Relation to Structural Ordering
  Published in: Polycrystalline Semiconductors III (p387)
• Optical Characterization of Ru₂Si₃ and Ru₂Ge₃ by Various Spectroscopic Methods and by Band Structure Calculations
  Published in: Polycrystalline Semiconductors V (p471)
• Synthesis of ß-FeSi₂-Films by Pulsed Laser Deposition
  Published in: Semiconductor Processing and Characterization with Lasers (p123)
• Wet-Chemically Passivated Silicon Interfaces: Characterization by Surface Photovoltage Measurements, and Spectroscopic Ellipsometry Methods
  Published in: Polycrystalline Semiconductors V (p515)