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Articles by keyword: «Acceptor»

• Acceptor Impurities in Silicion Carbide: Electron Paramagnetic Resonance and Optically Detected Magnetic Resonance Studies
  Published in: Defect and Diffusion Forum Vols. 148-149 (p129)
• Alloy Broadening of the Acceptor-Related Near-Gap Luminescence in Semiconductor Alloys
  Published in: Shallow Impurities in Semiconductors V (p105)
• Are there any Shallow Acceptors in GaN?
  Published in: Silicon Carbide, III-Nitrides and Related Materials (p1327)
• Beryllium-Related Defect Centers in 4H-SiC
  Published in: Silicon Carbide and Related Materials 2000 (p467)
• Carbon in LEC Grown GaAs Crystals
  Published in: Shallow Impurities in Semiconductors V (p405)
• Confinement Effects on the Electronic Structure of Shallow Acceptors in GaAs/AlGaAs Quantum Wells
  Published in: Defects in Semiconductors 17 (p657)
• Donor Concentration Dependence of GaP Luminescence
  Published in: Shallow Impurities in Semiconductors V (p375)
• Donors and Acceptors in SiC-Studies with EPR and ENDOR
  Published in: Silicon Carbide and Related Materials - 1999 (p785)
• Doping of Wide-Gap II-VI Compounds for Short-Wavelength Visible Light Emitting Devices
  Published in: Defects in Semiconductors 17 (p385)
• Electrical Characterization of Dopants and Deep Level Defects for III-V Nitrides Grown by Metalorganic Chemical Vapor Deposition
  Published in: Silicon Carbide, III-Nitrides and Related Materials (p1375)
• Electrically Active Centers in Silicon Doped with Erbium
  Published in: Defects in Semiconductors 18 (p615)
• Electron Paramagnetic Resonance of the Scandium Acceptor in 4H and 6H Silicon Carbide
  Published in: Silicon Carbide and Related Materials - 1999 (p809)
• Electronic Structure of Acceptors in Silicon Carbide
  Published in: Silicon Carbide, III-Nitrides and Related Materials (p581)
• Endor and ODEPR Investigation of the Microscopic Structure of the Boron Acceptor in 6H-SiC
  Published in: Defects in Semiconductors 17 (p63)
• Extremely Heavy Doping of Carbon in GaAs and InGaAs
  Published in: Shallow Impurities in Semiconductors V (p37)