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Articles by keyword: «FeRAM»

• Barium, Strontium and Bismuth Contamination in CMOS Processes
  Published in: Ultra Clean Processing of Silicon Surfaces V (p9)
• Cell Sensing Margin of Lead-Free (Bi,La)₄Ti₃O₁₂Thin Film Deposited on MTP Cell Structure in High Density FeRAM Device
  Published in: Eco-Materials Processing & Design VII (p530)
• Ferroelectric Properties of Lead-Free (Bi,La)₄Ti₃O₁₂ Thin Film Deposited on MTP Cell Structure for High Density FeRAM Device
  Published in: Eco-Materials Processing & Design VI (p285)
• Grain Size and Orientation Control in Lead-Free (Bi,La)₄Ti₃O₁₂ Thin Film Deposited by Spin-On Method for High Density FeRAM Device
  Published in: Eco-Materials Processing and Design VIII (p577)
• Microstructure and Electric Properties of Sol-Gel PLZT Thin Films
  Published in: Electroceramics in Japan II (p131)
• The Influence of Annealing Treatment on Physics and Electrical Characteristics of Ba(Zr_0.1Ti_0.9)O₃ Ferroelectric Films on ITO/Glass Substrate
  Published in: High-Performance Ceramics VI (p289)