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Articles by keyword: «Near Interface Traps»

• Detection and Electrical Characterization of Defects at the SiO₂/4H-SiC Interface
  Published in: Silicon Carbide and Related Materials 2009 (p463)
• Instability of 4H-SiC MOSFET Characteristics due to Interface Traps with Long Time Constants
  Published in: Silicon Carbide and Related Materials 2010 (p603)
• Investigation of Oxide Films Prepared by Direct Oxidation of C-Face 4H-SiC in Nitric Oxide
  Published in: Silicon Carbide and Related Materials 2009 (p515)
• Investigation of SiO₂-SiC Interface by High-Resolution Transmission Electron Microscope
  Published in: Silicon Carbide and Related Materials 2005 (p975)
• The Search for Near Interface Oxide Traps - First-Principles Calculations on Intrinsic SiO₂ Defects
  Published in: Silicon Carbide and Related Materials 2004 (p569)