HOME CONTACT My eBook

Username: Password:

> @scientific.net

Articles by keyword: «Oxygen Impurity»

• "New Donors" in Czochralski Grown Silicon Annealed at T≥ 600°C under Compressive Stress
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p181)
• Defects Involving Oxygen in Crystalline Silicon
  Published in: Defect Interaction and Clustering in Semiconductors (p285)
• DLTS Studies of Thermally Treated Carbon-Rich Silicon
  Published in: Defects in Semiconductors 17 (p153)
• Electrically Active Centers in Silicon Doped with Erbium
  Published in: Defects in Semiconductors 18 (p615)
• IR Studies of Oxygen-Yacancy Related Defects in Irradiated Silicon
  Published in: Defects and Diffusion in Semiconductors (p1)
• The Effect of Milling Conditions and Impurites on the Properties of Mechanically Alloyed Zr-Based Metallic Glasses With Wide Supercooled Liquid Region
  Published in: Synthesis and Properties of Mechanically Alloyed and Nanocrystalline Materials (p29)