HOME CONTACT My eBook

Username: Password:

> @scientific.net

Articles by keyword: «STM»

• A Comparison between BTA and Amidoximes and their Interactions with Copper Surfaces
  Published in: Ultra Clean Processing of Semiconductor Surfaces X (p231)
• AFM and STM Investigations of Electroluminescent SiO₂/Si Superlattices Prepared by Chemical Vapour Deposition
  Published in: Light Emission from Silicon (p13)
• Applications of Scanning Tunneling Microscopy to Corrosion Research
  Published in: Electrochemical Methods in Corrosion Research V (p765)
• Atomic and Electronic Structure of the (2×1) and c(2×2) 4H-SiC(1-102) Surfaces
  Published in: Silicon Carbide and Related Materials 2007 (p291)
• Atomic Crack Defects Developing at Silicon Carbide Surfaces Studied by STM, Synchrotron Radiation-Based μ-spot XPS and LEEM
  Published in: Silicon Carbide and Related Materials 2006 (p481)
• Characterization of Semiconductor Surfaces and Interfaces by X-Ray Reflectivity Measurements
  Published in: Defects in Semiconductors 17 (p561)
• Characterization of TiN Protective Coatings
  Published in: Contemporary Studies in Condensed Matter Physics (p357)
• Electrical Properties of G4-48azo Dendrimer Containing Azobenzene Functional Groups
  Published in: Designing, Processing and Properties of Advanced Engineering Materials (p913)
• Growth of Graphene Layers on Silicon Carbide
  Published in: Silicon Carbide and Related Materials 2008 (p199)
• Investigation of Atomic Structure Ahead of Crack Tip by STM and AFM
  Published in: Fracture and Strength of Solids III (p129)
• Nanoscale Topography of GC/Pt-C and GC/Pt-Ru-C Electrodes Studied by Means of STM, AFM and XRD Methods
  Published in: Recent Developments in Advanced Materials and Processes (p271)
• Nanotechnology at Present and its Promise for the Future
  Published in: Materials Science, Testing and Informatics I (p85)
• Nanowire Reconstruction on the 4H-SiC(1102) Surface
  Published in: Silicon Carbide and Related Materials 2006 (p529)
• Nucleation and Reaction of Ag on 4H-SiC(0001)
  Published in: Silicon Carbide and Related Materials 2004 (p741)
• Observations of Carbon Nanotube Field Emission Failure in the Transmission Electron Microscope
  Published in: PRICM-5 (p4071)