HOME CONTACT My eBook

Username: Password:

> @scientific.net

Articles by keyword: «Si-SiO₂ Interface»

• Hydrogen Interaction with Point Defects in the Si-SiO₂ Structures and its Influence on the Interface Properties
  Published in: Gettering and Defect Engineering in Semiconductor Technology XII (p345)
• Hydrogen-Enhanced Transformation of Eletrical and Structural Properties of Thin Subsurface Ion Implanted Silicon Layer in SiO₂-Si Systems
  Published in: Gettering and Defect Engineering in Semiconductor Technology VIII (p595)
• Interaction of Point Defects with Impurities in the Si-SiO₂ System and its Influence on the Interface Properties
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIV (p263)
• Interaction of Point Defects with Impurities in the Si-SiO₂ System and its Influence on the Properties of the Interface
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIII (p145)
• Point Defects Generation Kinetics in the Si-SiO₂ System and its Influence on the Interface Properties
  Published in: Global Research and Education (p102)
• Role of Electron / Hole Processes in the Initial Stage of Silicon Anodization
  Published in: Passivation of Metals and Semiconductors (p115)