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Articles by keyword: «Surface Recombination Velocity»

• Determination of Interface State Density Distribution and Surface Recombination Velocity on Passivated Semiconductor Surfaces by Photoluminescence Surface State Spectroscopy
  Published in: Passivation of Metals and Semiconductors (p53)
• Electrical Characterization of As-Grown and Thermally Treated 8'' Silicon Wafers
  Published in: Gettering and Defect Engineering in Semiconductor Technology VIII (p143)
• Mapping of Defect-Related Silicon Properties with the ELYMAT Technique in Three Dimensions
  Published in: Semiconductor Processing and Characterization with Lasers (p159)
• Nondestructive and Contactless Evaluation of Electrical and Thermal Properties of Thin Semiconducting Layers
  Published in: Semiconductor Processing and Characterization with Lasers (p265)
• Optimization of the Specific On-Resistance of 4H-SiC BJTs
  Published in: Silicon Carbide and Related Materials 2005 (p1429)
• Use of Photoinduced Microwave Reflection for the Non-Destructive Characterization of Solar Cell Materials and Device Structures
  Published in: Semiconductor Processing and Characterization with Lasers (p171)