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Articles by keyword: «Thermally Stimulated Currents»

• A Study of the Shallow Electron Traps at the 4H-SiC/SiO₂ Interface
  Published in: Silicon Carbide and Related Materials - 2002 (p547)
• Characteristics of Mobile Ions in the SiO₂ Films of SiC-MOS Structures
  Published in: Silicon Carbide and Related Materials 2001 (p1017)
• Defects, their Interaction and Modification by Irradiation in Semi-Insulating GaAs
  Published in: Ultrafast Phenomena in Semiconductors 2001 (p317)
• Effects of Activation Annealing on Thermally Stimulated Current in Semi-Insulating LEC GaAs Substrates
  Published in: Defects in Semiconductors 18 (p243)
• New Evidence of Interfacial Oxide Traps in n-Type 4H- and 6H-SiC MOS Structures
  Published in: Silicon Carbide and Related Materials 2001 (p1001)