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Articles by keyword: «XTEM»

• Depth Resolved Defect Analysis by Micro-Raman Investigations of Plasma Hydrogenated Czochralski Silicon Wafers
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p141)
• Formation of SiC/Si Multilayer Structures on Si(100) by Supersonic Free Jets of Single Gas Source CH₃SiH₃
  Published in: Silicon Carbide and Related Materials 2003 (p325)
• Growth of SiC on 6H-SiC {01-14} Substrates by Gas Source Molecular Beam Epitaxy
  Published in: Silicon Carbide and Related Materials - 1999 (p201)
• Microstructural Evolution in High Temperature Nitrogen Implanted Stainless Steel
  Published in: Metastable, Mechanically Alloyed and Nanocrystalline Materials (p185)
• Modification of MeV He Implantation-Induced Cavities in Silicon by Hydrogen Plasma Treatment
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p307)
• The Use of Dislocations as an 'Atomic Saw' to Cut 2D Structures - Interest for Plasticity Studies
  Published in: Dislocations '93 (p507)
• Transmission-Electron-Microscopy Observations on the Growth of Epitaxial Graphene on 3C-SiC(110) and 3C-SiC(100) Virtual Substrates
  Published in: HeteroSiC & WASMPE 2011 (p242)
• XTEM Observation of 4H-SiC (0001) Surfaces Processed by Plasma Assisted Polishing
  Published in: Ultra-Precision Machining Technologies (p156)