FPGA Auto Configuration Based on ATE

Abstract:

FPGAs (Field Programmable Gate Arrays) are highly integrated devices which can be programmed as variable functions. The application-level testing of FPGAs usually include multiple reconfigurations and relevant functional tests respectively through ATEs (Automated Test Equipments). However, test engineers are facing a tough problem to reconfigure FPGAs automatically through an ATE instead of using specific tools and download cables provided by FPGAs manufacturers. This paper takes example for XILINX Virtex-E series, presents two different methods for FPGA auto configuration based on an ATE using JTAG configuration interface and boundary-scan protocol, and accomplishes the entire auto configuration-test procedure by a single ATE.

• Periodical: Applied Mechanics and Materials (Volumes 121-126)
• Pages: 3310-3314
• DOI: https://doi.org/10.4028/www.scientific.net/AMM.121-126.3310
• Online since: October 2011
• Authors: Qian Liu, Dan Wu
• Keywords: Auto Configuration, Boundary Scan, Field-Programmable Gate Array (FPGA), JTAG

References

[1] Huang W K, Meyer F J, Lombardi F: Array-based Testing of FPGAs: Architecture and Complexity. Proceedings IEEE Conference on Innovative Systems in Silicon (1997), pp.249-258.

DOI: 10.1109/iciss.1996.552432

[2] XILINX, Inc: Configuration and Readback of Virtex FPGAs Using JTAG Boundary-Scan (2007), pp.3-4.