FPGA Auto Configuration Based on ATE

Abstract:

Article Preview

FPGAs (Field Programmable Gate Arrays) are highly integrated devices which can be programmed as variable functions. The application-level testing of FPGAs usually include multiple reconfigurations and relevant functional tests respectively through ATEs (Automated Test Equipments). However, test engineers are facing a tough problem to reconfigure FPGAs automatically through an ATE instead of using specific tools and download cables provided by FPGAs manufacturers. This paper takes example for XILINX Virtex-E series, presents two different methods for FPGA auto configuration based on an ATE using JTAG configuration interface and boundary-scan protocol, and accomplishes the entire auto configuration-test procedure by a single ATE.

Info:

Periodical:

Edited by:

Dongye Sun, Wen-Pei Sung and Ran Chen

Pages:

3310-3314

DOI:

10.4028/www.scientific.net/AMM.121-126.3310

Citation:

Q. Liu and D. Wu, "FPGA Auto Configuration Based on ATE", Applied Mechanics and Materials, Vols. 121-126, pp. 3310-3314, 2012

Online since:

October 2011

Authors:

Export:

Price:

$35.00

In order to see related information, you need to Login.

In order to see related information, you need to Login.