Storage Test Techniques and Wireless Transmission Based on Embedded System

Hong Wu; Tao Han; Can Wang

doi:10.4028/www.scientific.net/AMM.128-129.1020

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 128-129Storage Test Techniques and Wireless Transmission...

Storage Test Techniques and Wireless Transmission Based on Embedded System

Abstract:

Memory test technology is the most effective means to record the parameters of moving objects under special circumstances. This paper introduced the development of storage test systems based on ARM7LPC21XX. PHILIPS chip 16/32-bit microcontroller-LPC21XX was a 16/32-bit ARM7 TDMI-S CPU microcontroller based on a real-time emulation and embedded trace. It had two powers-saving modes-power down and idles, which could ensure the battery to work for a long time. The microcontroller internal 10-bit AD was used to sample data as well as SPI and NRF24L01 modules to realize communication.

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Periodical:

Applied Mechanics and Materials (Volumes 128-129)

Pages:

1020-1024

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.128-129.1020

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Online since:

October 2011

Authors:

Hong Wu, Tao Han, Can Wang

Keywords:

ARM7, Embedded System, Low Power Consumption, NRF24L01, SPI

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