Elimination of Scan Blindness in Rectangular Waveguide End-Slot Phased Arrays Using High-Impedance Surface

Wei Zhu; Xv Fu Lu; Qiang Gao

doi:10.4028/www.scientific.net/AMM.130-134.3200

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 130-134Elimination of Scan Blindness in Rectangular...

Elimination of Scan Blindness in Rectangular Waveguide End-Slot Phased Arrays Using High-Impedance Surface

Abstract:

High-impedance ground plane (HIGP) is applied in the design of rectangular waveguide end-slot phased array. The benefits of using such a HIGP are related to the suppression of surface waves because of its obvious frequency bandgap and, therefore, the scan blindness could be eliminated. Both of the bandgap curve of the HIGP structure and the scan properties of the phased arrays have been calculated. The elimination of scan blindness is obtained.

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Periodical:

Applied Mechanics and Materials (Volumes 130-134)

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3200-3203

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.130-134.3200

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Online since:

October 2011

Authors:

Wei Zhu, Xv Fu Lu, Qiang Gao

Keywords:

High-Impedance Ground Plane (HIGP), Phased Array, Scan Blindness, Surface Wave

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