Testing Analog Circuits by PCA of Power Supply Current

Abstract:

A method using principal component analysis (PCA) of dynamic power supply current was proposed for testing of analog circuits in this paper. The basic model of the proposed method and the general rule for analog fault detection were described in detail. At first, the principal component model of fault-free circuits was constructed. Then the circuits-under-test was compared with the principal component model to calculate the statistic for fault detection. The features of power supply current in both time and frequency domain were combined by PCA, and it could overcome the difficulty to determine threshold by empirical knowledge. The proposed method was applied to detect faults of the signal filtering and amplifying circuit, which is used in the ultrasonic liquid-level sensor. The results show that the power supply current contains information about the circuit’s faults, and can be used for fault detection of analog circuits by analyzing this signal.

• Periodical: Applied Mechanics and Materials (Volumes 157-158)
• Pages: 641-645
• DOI: https://doi.org/10.4028/www.scientific.net/AMM.157-158.641
• Online since: February 2012
• Authors: Guo He, Chao Jie Zhang, Guang Hui Chang, Shu Hai Liang
• Keywords: Analog Circuits, Fault Detection, Power Supply Current, Principal Component Analysis (PCA)

References

[1] M. Aminian and F. Aminian: Neural-network based analog circuits fault diagnosis using wavelet transform as preprocessor, IEEE Transactions on Circuits and Systems II, Analog and Digital Signal Processing, vol. 47, no. 2 (2000), pp.151-156.

DOI: 10.1109/82.823545

[2] C. Zhang, G. He, and S. Liang: Test point selection of analog circuits based on fuzzy theory and ant colony algorithm, in Proceedings of IEEE AUTOTESTCON, Salt Lake, USA (2008), pp.164-168.

DOI: 10.1109/autest.2008.4662605

[3] B.K.S.V.L. Varaprasad, L.M. Patnaik, H.S. Jamadagni and V.K. Agrawal: A new ATPG technique (MultiDetect) for testing of analog macros in mixed-signal circuits, IEEE Tran. Computer-Aided Design of Integr. Circuits Syst., vol. 23, no. 2 (2004).

DOI: 10.1109/tcad.2003.822110

[4] A. srivastava, V. K. Pulendra and S. Yellampalli: A combined noise analysis and power supply current based testing of CMOS analog integrated circuits, in Proceedings of SPIE Conference on Noise in Devices and Circuits, Austin, USA (2005).

DOI: 10.1117/12.609258

[5] D.K. Papakostas and A.A. Hatzopoulos: A unified procedure for fault detection of analog and mixed-mode circuits using magnitude and phase components of the power supply currents spectrum, IEEE Transactions on Instrumentation and Measurement, vol. 57, no. 11 (2008).

DOI: 10.1109/tim.2008.924932

[6] I.M. Bell, S.J. Spinks and J.M. Silva: Supply current test of analogue and mixed signal circuits, IEE Proc. -Circuits Devices Syst., vol. 143, no. 6 (1996), pp.399-407.

DOI: 10.1049/ip-cds:19960903

[7] S. Bhunia and K. Roy: Dynamic supply current testing of analog circuits using wavelet transform, in Proceedings of the 20th IEEE VLSI Test Symposium (2002), pp.302-307.

DOI: 10.1109/vts.2002.1011158

[8] G.R. Halligan and S. Jagannathan: PCA-based fault isolation and prognosis with application to pump, International Journal of Advanced Manufacturing Technology, vol. 55, no. 5-8 (2011), pp.699-707.

DOI: 10.1007/s00170-010-3096-2

[9] J.C. Jeng: Adaptive process monitoring using efficient recursive PCA and moving window PCA algorithms, Journal of the Taiwan Institute of Chemical Engineers, vol. 41, no. 4 (2010), pp.475-481.

DOI: 10.1016/j.jtice.2010.03.015