Design an Auto-Recharging System for Mobile Robots

Article Preview

Abstract:

The article develops an auto-charging system for mobile robots, and programs a new docking processing to enhance successful rate. The system contains a docking station and a mobile robot. The docking station contains a docking structure, a limit switch, a charger, two power detection modules and two wireless RF modules. The mobile robot contains a power detection module (voltage and current), an auto-switch, a wireless RF module, a charging connection structure and a laser range finder. The docking structure is designed with one active degree of freedom and two passive degrees of freedom. The power detection module is controlled by HOLTEK microchip. We calculate the power values using the redundant management method and statistical signal prediction method, and develop an auto-recharging processing using multiple sensors and laser range finder for mobile robots. The processing can enhances the successful rate to guide the mobile robot moving to the docking station. In the experimental results, the power of the mobile robot is under the threshold value. The mobile robot transmits the charging command to the docking station via wireless RF interface, and searches the landmark of the docking station using laser range finder (SICK). The laser range finder guides the mobile robot approach to the docking station. The mobile robot touches the docking station to trig the power detection device. The docking station supplies the power to the mobile robot by charger, and detects the current and voltage values of the charging processing. The charging current of the docking station is under the threshold value. The docking station turns off the charging current, and trigs the mobile robot leaving the docking station via wireless RF interface.

You might also be interested in these eBooks

Info:

Periodical:

Pages:

666-672

Citation:

Online since:

July 2012

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2012 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] R. C. Luo, K. L. Su and C. W Deng, Power Supply Diagnosis System Using Redundant Sensor for Intelligent Security Robot, IEEE International Conference on Industrial Electronic, Control, and Instrumentation(IECON2003), PP. 2500-2506.

Google Scholar

[2] K. L. Su, Automatic Fire Detection System Using Adaptive Fusion Algorithm for Fire Fighting Robot, IEEE International Conference on System, Man and Cybernetics (SMC 2006), Grand Hotel, Taipei, Taiwan, October 2006, pp.966-971.

DOI: 10.1109/icsmc.2006.384525

Google Scholar

[3] T. L. Chien, J. H. Guo, K. L. Su and S. V. Shiau, Develop a Multiple Interface Based Fire Fighting Robot, IEEE International Conference on Mechatronics (ICM 2007), Kumamoto, Japan, May 8-10, 2007, WA1-B-3.

DOI: 10.1109/icmech.2007.4280040

Google Scholar

[4] K. L. Su, J. H. Tzou and C. C. Liu, Development of a Multisensor-Based Residual Power Prediction System for Mobile Robots, IEEE Workshop on Advanced Robotics and its Social Impacts 2007, Hsinchu, Taiwan, December 9-11, 2007, pp.114-119.

DOI: 10.1109/arso.2007.4531424

Google Scholar

[5] A.J. Melia, supply-current analysis (SCAN) as a screen for bipolar integrated circuits, Electronics Letters, vol. 14 num14 1978, pp.434-436.

DOI: 10.1049/el:19780291

Google Scholar

[6] G. .F. Nelson, W. F. Boggs, parametric tests meet the challenge of high-density ICs, Electronics, 1975 Dec. PP108-111.

Google Scholar

[7] M. W. Levi, CMOS is most testable, Proceedings of International Test Conference. 1981, PP. 217-220.

Google Scholar

[8] Y. K. Malaiya, Testing stuck-on faults in CMOS integrated circuits, Proceedings of International Conference on Computer-Aided Design, 1984, PP. 248-250.

Google Scholar

[9] Y. K. Malaiya, S. Y. H. Su, A new fault model and testing technique for CMOS devices, Proceedings of International Test Conference, 1982, PP. 25-34.

Google Scholar

[10] J. F. Frenzel, Power-Supply Current Diagnosis of VLSI Circuits, IEEE Transaction on reliability Vol. 43, No. 1 1994, PP. 30-38.

DOI: 10.1109/24.285105

Google Scholar

[11] K. Horning et al, Measurements of quiescent power supply current for CMOS ICs in production testing, Proceedings of International Test Conference 1987 pp.300-309.

Google Scholar

[12] M. sodden and C. F. Hawkins, Test considerations for gate oxide shorts in CMOS ICs, IEEE DEsesign & Test, 1086 Aug, pp.56-64.

DOI: 10.1109/mdt.1986.294977

Google Scholar

[13] K. L. Su, T. L. Chien and J. H. Guo, Decelop a Seft-diagnosis Function Auto-recharging Device for Mobile Robot,, IEEE International Workshop on Safety, Security, and Rescue Robot (SSRR2005), pp.1-6.

DOI: 10.1109/ssrr.2005.1501236

Google Scholar