Test Method for Crosstalk Faults in VLSI Circuits Based on Multiple-Valued Decision Diagrams

Abstract:

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The crosstalk fault in VLSI circuits is one of the interference effects being caused by parasitic capacitance and inductance coupling, it can lead to functional errors of circuits. It is necessary to detect the crosstalk faults in order to insure the functions of circuits. A new test method for crosstalk faults in VLSI circuits based on multiple-valued decision diagrams is presented in this paper, the test vectors of crosstalk faults are generated by building a multiple-valued decision diagram that is a difference operation of the two multiple-valued decision diagrams corresponding to the normal circuit and faulty circuit, respectively. One advantage of the test method is that it can get all test vectors of a given crosstalk fault, therefore for a digital circuit, the test set with minimal number of test vectors can be obtained. Experimental results on a lot of digital circuits demonstrate the feasibility of the method proposed in this paper.

Info:

Periodical:

Edited by:

Qi Luo

Pages:

641-646

DOI:

10.4028/www.scientific.net/AMM.20-23.641

Citation:

Z. L. Pan and L. Chen, "Test Method for Crosstalk Faults in VLSI Circuits Based on Multiple-Valued Decision Diagrams", Applied Mechanics and Materials, Vols. 20-23, pp. 641-646, 2010

Online since:

January 2010

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$35.00

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