A Novel Markov Model and its Application to BIT System

Wen Rong Zheng; Shu Zong Wang

doi:10.4028/www.scientific.net/AMM.239-240.721

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 239-240A Novel Markov Model and its Application to BIT...

A Novel Markov Model and its Application to BIT System

Abstract:

Intermittent fault is the main factor for the raise of false alarm during the process of the detection in built-in test (BIT). Two-state Markov model and three-state Markov model for test is built for system fault diagnosis with BIT. According to the application of BIT in some complex system, a comparison of the false alarm rate between two-state Markov model and three-state Markov model is present, which shows we can reduce the false alarm rate (FAR) and improve fault detection rate by using three-state Markov model in BIT.

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Periodical:

Applied Mechanics and Materials (Volumes 239-240)

Pages:

721-725

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.239-240.721

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Online since:

December 2012

Authors:

Wen Rong Zheng, Shu Zong Wang

Keywords:

Bit, False Alarm Rate, Intermittent Fault, Markov Model

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References

[1] Dree R, Young N. Role of BIT in support system maintenance and availability [J]. IEEE A&E System Magazine, 2004, 8:482-483.

Google Scholar

[2] Toczek W. An oscillation-based built-in test scheme with AGC loop [J]. Measurement, 2008, 41: 160-168.

DOI: 10.1016/j.measurement.2006.06.007

Google Scholar

[3] Ismaeel A A，Bhatnagar R. Test for detection and location of intermittent faults in combinational circuits [J]. IEEE transactions on reliability, 1997, 46(2):269-274.

DOI: 10.1109/24.589956

Google Scholar

[4] Bryan S, Floyd B, Nathan O. Intermittent fault detection and isolation system [J]. IEEE Autotestcon, 2008.

Google Scholar

[5] Samir K, Carl V P. Intermittent faults: A model and a detection procedure [J]. IEEE transactions on computers, 1974, C23 (7):713-719.

Google Scholar

[6] Rosenthal D, Wadell B C. Predicting and eliminating built-in test false alarm [J]. IEEE Trans. On Reliability, 1990, 39(4):500-505.

DOI: 10.1109/24.58728

Google Scholar