Multistage MMIC Power Amplifier Automatic Testing System

Si Hua Ouyang; Ming Zeng Peng; Jin Wu; Yan Kui Li; Xin Yu Liu

doi:10.4028/www.scientific.net/AMM.241-244.227

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 241-244Multistage MMIC Power Amplifier Automatic Testing...

Multistage MMIC Power Amplifier Automatic Testing System

Abstract:

Based on GaN HEMT the monolithic microwave power amplifier (MMIC) with great advantages of high operating voltage, high output power, wide frequency bandwidth and small features loss has been widely used in phased-array radar, aerospace, missile interception system. However, MMIC test has many disadvantages, such as, including many microwave instruments, test process is complex, manual operate lots of instruments, and write down test data, result in slowed down test process. In the paper, it introduces a new system by ourselves. This can simplify the MMIC test process, and free ourselves from heavy test task, and focus the performance of circuit. It realizes the automatic test and proves it using a based on GaN HEMT 2×4 MMIC circuit.

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Periodical:

Applied Mechanics and Materials (Volumes 241-244)

Pages:

227-233

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.241-244.227

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Online since:

December 2012

Authors:

Si Hua Ouyang, Ming Zeng Peng, Jin Wu, Yan Kui Li, Xin Yu Liu

Keywords:

Agilent VEE, Automatic, Gan HEMT, MMIC, Multistage

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