Effect of Structural Parameters on High Frequency Characteristics of Microstrip Meander-Line Slow Wave Circuit

Chang Ting Chen

doi:10.4028/www.scientific.net/AMM.241-244.698

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 241-244Effect of Structural Parameters on High Frequency...

Effect of Structural Parameters on High Frequency Characteristics of Microstrip Meander-Line Slow Wave Circuit

Abstract:

A novel V-shaped microstrip meander-line slow-wave structure was investigated to expand the operating bandwidth. The high frequency characteristics of V-shaped structure and traditional N-shaped and U-shaped structures were analyzed by electromagnetic simulation software HFSS, and the effects of different structural parameters on the high frequency characteristics were studied. The results show that the V-shaped structure provides better performance in operation bandwidth and interaction impedance than traditional structures, and when the dielectric rod replaces the dielectric slab the performance further improves.

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Periodical:

Applied Mechanics and Materials (Volumes 241-244)

Pages:

698-702

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.241-244.698

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Online since:

December 2012

Authors:

Chang Ting Chen

Keywords:

Dispersion, Interaction Impedance, Micro-Fabrication, Microstrip Meander-Line, Millimeter Wave, Slow Wave Structure

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References

[1] Bo Qu, Jinjun Feng. High efficiency millimeter wave TWT, Vacuum Electronics, No. 2 (2010) 16-20.

Google Scholar

[2] S. Sengel, H. R. Jiang and J. H. Booske. Microfabrication and characterization of a selectively metallized w-band meander-line TWT circuit, IEEE Transaction on Electron Devices, Vol. 56, No. 5 (2009) 730-737.

DOI: 10.1109/ted.2009.2015416

Google Scholar

[3] C. F. Fu, Y. Y. Wei and W. X. Wang. Radio-frequency characteristics of a printed rectangular helix slow-wave structure, Chinese Physics Letters, Vol. 25, No. 9 (2008) 3478-3481.

DOI: 10.1088/0256-307x/25/9/103

Google Scholar

[4] Rizwan Murji and Deen M Jamal. Accurate modeling and parameter extraction for meander-line N-well resistors, IEEE Transaction on Electron Devices, Vol. 52, No. 7 (2005) 1364-1369.

DOI: 10.1109/ted.2005.850637

Google Scholar

[5] Dayong Zhang, Jinjun Feng and Fujiang Liao: Cold-test characteristics simulation of microstrip meander-line slow wave structure, Chinese Journal of Electron Devices, Vol. 29, No. 4 (2006) 1223-1226.

DOI: 10.1109/ivec.2016.7561885

Google Scholar

[6] Changting Chen, Yubin Gong and Fei Shen. Design of a new microstrip meander-line slow wave structure, Vacuum Electronics, No. 2 (2011) 1-4.

Google Scholar