The SCR Protection Circuit Evaluation in HV DEMOS Devices

Shen Li Chen; Chien Chin Tseng

doi:10.4028/www.scientific.net/AMM.256-259.2923

Paper Titles

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Efficient Data Streams Based Closed Frequent Itemsets Mining Algorithm
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The Study and Experiment of Advance Control of Chaotic Vibration Mill with High Vibration Intensity Based on SCM (II) — The System Construction and the Controlling Methods
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The Method of Unity3D-Based 3D Dynamic Interactive Query of High Arch Dam Construction Information
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The SCR Protection Circuit Evaluation in HV DEMOS Devices
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The Research of Chinese Website Brand Value Evaluation System
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Design and Implementation of the Embedded-Based Advertising Player
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An Artificial Immune Based Incremental Data Clustering Algorithm
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Weighted Boundedness of Commutators of Riesz Transforms Associated with Schrödinger Operator
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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 256-259The SCR Protection Circuit Evaluation in HV DEMOS...

The SCR Protection Circuit Evaluation in HV DEMOS Devices

Abstract:

The electrostatic discharge (ESD) failure of power drain-extended MOS (DEMOS) devices, the protection circuit SCR, and a DEMOS with SCR protection circuit will be investigated in this paper. The ESD immunity of the DEMOS was very poor under the human-body model (HBM) testing. Here we discuss how to design an ESD good SCR device. Eventually, the ESD immunity of DEMOS test sample with an SCR circuit can significantly improve device ESD performance.