FPGA+USB-Based Real-Time Data Processing System for Defects Inspection by CCD Scanning

Peng Wang; Chi Zhong Wang; Ze Sen Liu; Xu Han; Cao Wang Si; Xiang Guo Du; Chang Ming Sun; Jing Jing Wu

doi:10.4028/www.scientific.net/AMM.278-280.749

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 278-280FPGA+USB-Based Real-Time Data Processing System...

FPGA+USB-Based Real-Time Data Processing System for Defects Inspection by CCD Scanning

Abstract:

In this paper, the real-time defects inspection was implemented via use of paralleled structure and high-speed operation of FPGA. The hardware circuit based on FPGA was established. According to signal characteristics of polymeric film defects, the preprocessing scheme of defect images based on FPGA was designed. The defect data were packed according to the defined format. Data processed were transferred to PC through USB2.0 real-timely to reconstruct defect microscopic images. The quantity of transferred data was decreased tremendously by this method. The inspecting speed was greatly improved.

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Periodical:

Applied Mechanics and Materials (Volumes 278-280)

Pages:

749-752

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.278-280.749

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Online since:

January 2013

Authors:

Peng Wang, Chi Zhong Wang, Ze Sen Liu, Xu Han, Cao Wang Si, Xiang Guo Du, Chang Ming Sun, Jing Jing Wu

Keywords:

Charge Coupled Device, Data Processing System, Defects Inspection, Field-Programmable Gate Array (FPGA), Universal Serial Bus

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References

[1] X.K. Li, X.L. Gao and Y.C. Guo: ICIC. Express. Lett. Vol. 6 (2012), pp.2225-2230.

Google Scholar

[2] P.L. He: J. Comput. Inf. Vol. 8 (2012), pp.4233-4240.

Google Scholar

[3] S.H. Cui, H. Zhao, and X. Wang: Electric Machine and Control. Vol. 14 (2010), pp.87-90. (in Chinese).

Google Scholar

[4] Fukuchi, Tetsuo, ogata, and Takashi: IEEJ Trans. Electron. Inf. Syst. Vol. 130 (2010), pp.1095-1101.

Google Scholar

[5] X.F. Chen, X. Xu, and Z. Lin: High Power Laser and Particle Beams. Vol. 21 (2009), pp.1677-1680. (in Chinese).

Google Scholar

[6] D. Yongtae, L. Sangok, and K. Yoonsy: Meas. Sci. Technol. Vol. 22 (2011), pp.712-714.

Google Scholar

[7] G. Rosatl, G. Boschetti, A. Biondi and A. Rossi: Opt. Lasers. Eng. Vol. 47 (2009), pp.379-384.

Google Scholar

[8] H. Zhao, Y. Liu and C.L. Li: Chinese Journal of Scientific Instrument. Vol. 29 (2008), pp.1035-1039. (in Chinese).

Google Scholar