Anealing Effect on the Microstructure and Mechanical Properties of LaB₆ Films

Abstract:

Lathanum hexaboride films were deposited by dc magnetron sputtering with the same sputtering parameters. AFM, XRD, Raman spectrum was used to characterize the film. The as-deposited films were annealed at 400 ^oC, 500 ^oC and 600 ^oC, respectively. After 400 oC’s annealing, morphology of fracture cross-sections of the films exhibited evolutions from columnar to the equiaxial, and the crystallinity of the film was improved as well. It was also found annealing process generated negative effect on the film’s hardness and elastic modulus.

• Periodical: Applied Mechanics and Materials (Volumes 303-306)
• Pages: 2514-2518
• DOI: https://doi.org/10.4028/www.scientific.net/AMM.303-306.2514
• Online since: February 2013
• Authors: Li Jie Hu, Lin Zhang, Jie Lin, Guang Hui Min
• Keywords: Annealing Process, Fracture Microstructure, Lanthanum Hexaboride, Mechanical Property

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