The Study of Test Stimulus Optimization of Analog Circuit Based on AS-PSO Hybrid Algorithm

Hai Jun Lin; Qi Gao Wang; Ting Yu Sun; Ming Chao Dai; Xu Hui Zhang

doi:10.4028/www.scientific.net/AMM.303-306.582

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 303-306The Study of Test Stimulus Optimization of Analog...

The Study of Test Stimulus Optimization of Analog Circuit Based on AS-PSO Hybrid Algorithm

Abstract:

This paper proposes a novel approach to diagnosis the faults in analog circuits based on Volterra kernel and ant colony-particle swarm algorithms. In the analog circuit fault diagnosis, we use the Volterra kernel as the feature vector which makes the characteristic vector lumped Euclidean distance in serials of fault states under the same excitation signals as the fitness function. And the optimized the parameters are used to stimulate the multi- frequency sinusoidal signal. The AS-PSO hybrid algorithm is performed to find the best excitation signal parameters. Experimental results show that the proposed approach can achieve good faults diagnosis results.

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Periodical:

Applied Mechanics and Materials (Volumes 303-306)

Pages:

582-587

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.303-306.582

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Online since:

February 2013

Authors:

Hai Jun Lin, Qi Gao Wang, Ting Yu Sun, Ming Chao Dai, Xu Hui Zhang

Keywords:

Analog Circuits, AS-PSO Algorithm, Optimizing the Stimulus, Volterra Kernel

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