Paper Titles

A UWB Through-Wall-Detection Radar System Based on Android Devices
p.1518

Microwave Scan Inspection of HDPE Piping Thermal Fusion Welds for Lack of Fusion Defect
p.1523

Base on Real-Time Monitoring Software Integration Technology Research
p.1529

A Rapid Reserve Inspection Method for Opencast Mine Using Ordinary Digital Camera
p.1533

Research on Fault Feature Extraction Methods for Dynamic Analog Circuits
p.1538

Research on the Application of Weighted Grey Relational Analysis on the Failure Diagnosis of Complicated Electronic Equipment
p.1543

Design and Implementation of an On-Board Automatic Test System Based on CPCI Bus for Aerial Fire Control Equipment
p.1548

Fault Diagnostic Equipment of Electrical System Based on Embedded System
p.1552

Study on Grain Moisture Detection System Based on the Theory of Dielectric Properties
p.1558

HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 333-335Research on Fault Feature Extraction Methods for...

Research on Fault Feature Extraction Methods for Dynamic Analog Circuits

Article Preview

Abstract:

The existing dynamic analog circuits fault feature extraction methods are introduced. The research achievements and present development situation of four dynamic analog circuits fault feature extraction methods are summarized. The characters of each method are discussed. The develop directions of dynamic analog circuits fault feature extraction methods are pointed out.

You might also be interested in these eBooks

Measurement Technology and Engineering Researches in Industry

Info:

Periodical:

Applied Mechanics and Materials (Volumes 333-335)

Pages:

1538-1542

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.333-335.1538

Citation:

Cite this paper

Online since:

July 2013

Authors:

Xiao Bing Zhu, Shen Jian Chen, Kang Du, Yong Yu Chen

Keywords:

Dynamic Analog Circuits, Fault Feature Extraction, Frequency Characteristic, Network Analysis, Node-Voltage Sensitivity, Volterra Frequency-Domain Kernel

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

© 2013 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] Cheng Wang, Guangju Chen, Yongle Xie. Systems Engineering and Electronics. 2005, 27(3): 413~415, 460. In Chinese.

[2] Chenxi Xu, Guangju Chen, Xianzhi Zhang. Journal of Electronic Measurement and Instrument. 2009, 23(1): 11~15. In Chinese.

[3] Guanyuan Qiu, Xianjue Luo. Circuits [M]. Higher Education Press. 2006. In Chinese.

[4] J. Rutkowski and A. Macura. IEE Proc. 1986, (133): 279~284.

[5] H. Gupta, J. W. Bandler, J. A. Starzyk and J. Sharma. A Hierarchical Decomposition Approach for Network Analysis[Z]. In Proc. IEEE. Int Symp. Circuits Syst, 1982 : 643~646.

[6] Shiben Yu, Danfeng Xu. Journal of Beijing University of Posts and Telecommunications. 1991, 14(3): 29~37. In Chinese.

[7] Zhenghui Lin; Qiang Wu. Journal of Shanghai Jiaotong University. 1995, 29(1): 35~40. In Chinese.

[8] Shiyuan Yang. Fault Diagnosis and Design for Testability of Analog System [M]. Tsinghua University Press, 1993. In Chinese.

[9] Chun Cui. Journal of Xi'an Jiaotong University. 1999, 30(3): 15~20. In Chinese.

[10] Feng Li, Tiejun Deng. Journal of Applied Sciences . 1998, 16(3): 253~261. In Chinese.

[11] Lei Xu, Shengjian Chen, Mengmeng Wang, Yuefang Wang. Microelectronics. 2010, 40(6): 857~860, 874. In Chinese.

[12] Shirong Yin, Guangju Chen, Yongle Xie. Control and Decision. 2006, 21(10): 1134~1137, 1142. In Chinese.

[13] Hong Xie, Yigang He. Chinese Journal of Scientific Instrument . 2006, 27(5): 512~514, 540. In Chinese.

[14] Jian Zhao, Zhenghui Lin. Journal of Shanghai Jiaotong University. 1998, 32(1): 8~11. In Chinese.

[15] W. Ou, C. Z. Han and W. Z. Wang. Control and Decision. 2002, 17(2): 239~242. In Chinese.

[16] T. H. Wang and J. Thomas. IEEE Trans on Microwave Theory and Techniques. 2003, 51(5): 134~144.

[17] Shirong Yin. Study on Fault Diagnosis for Nonlinear Circuit Based on Volterra Series and Neural Networks [D]. Ph.D. Thesis of UESTC. 2007. In Chinese.

[18] Chenxi Xu, Guangju Chen, Guixiang Li. Chinese Journal of Scientific Instrument. 2008, 29(10): 2090~2095. In Chinese.