Analysis the Actual Nanostructure of α Phase Polyoctylfluorene Thin Film via Synchrotron Grazing-Incidence X-Ray Diffraction

Abstract:

The nanostructure of α phase polyoctylfluorene thin film was characterized using normal X-ray diffraction, one-dimensional out-of-plane grazing incidence X-ray diffraction and two-dimensional grazing incidence X-ray diffraction with lab diffractometer and synchrotron diffractometer. The results show that using grazing incidence X-ray diffraction the weak diffraction signal of thin film can be observed after the elimination of background signals. Incorrect (h10) diffraction signals can be collected by lab diffractometer due to its low collimation and resolution, which can be overcome by using synchrotron diffractometer with high collimation and resolution that reveal the actual microstructure of polyoctylfluorene thin film.

• Periodical: Applied Mechanics and Materials (Volumes 333-335)
• Pages: 1832-1835
• DOI: https://doi.org/10.4028/www.scientific.net/AMM.333-335.1832
• Online since: July 2013
• Authors: Liu Ran Chen*, Xi Chen, Ji Cai Liang, Ji Dong Zhang
• Keywords: Actual Nanostructure, Grazing Incidence X-Ray Diffraction, Polyoctylfluorene

References

[1] Ron Mertens, The OLED Handbook: A Guide to OLED Technology, Industry & Market.

[2] U. Scerf, et al., Advance in Polymer Science (212) Polyfluorenes, Springer (2008).

[3] D. Yan, H. Wang, B. Du, Introduction to Organic Semiconductor Heterojunctions, John Wiley & Sons.

[4] M. Brinkmann, J Polym Sci Pol Phys Vol 49 (2011) pp.1218-1233.

[5] S. Chen, A. Su, S. Su, S. Chen, Macromolecules Vol 38 (2005) 379-385.

[6] M. Hung, J. Liao, S. Chen, S. Chen, A. Su, J. Am. Chem. Soc. Vol 127(2005)14576-14577.

[7] K. N. Stoev, K. Sakurai, Spectrochimica Acta Part B Vol 54 (1999)41–82.

[8] B. Yao, B. Zhang, J. Ding, Z. Xie, J. Zhang, L. Wang, Org. Electron. Vol 14 (2013) 897–901.