Experiments and Evaluation Based Pixellated CZT Semiconductor Detector

Min Shen; Zhi Ling Tang

doi:10.4028/www.scientific.net/AMM.341-342.1109

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 341-342Experiments and Evaluation Based Pixellated CZT...

Experiments and Evaluation Based Pixellated CZT Semiconductor Detector

Abstract:

Cadmium zinc telluride (CZT) material is one of the preferred materials for the fabrication of X-ray and gamma-ray detector. In this paper, it is presented an experimental detector system based on pixellated CZT semiconductor detector. At the same time, some research and design on the surface signal-readout method and the preamplifier circuitry is made. The signal coming from the CdZnTe material exposed to the radiation through the experiment is successfully required. The collection-efficiency between the electron and the hole in the anode is test when the different bias is applied in the pixellated CZT semiconductor detector. The parameter of the CZT detector and validate the responsive effect for the radiation is evaluated.The experiments and evaluation basis for the development of subsequent gamma spectrometer.

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Periodical:

Applied Mechanics and Materials (Volumes 341-342)

Pages:

1109-1112

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.341-342.1109

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Online since:

July 2013

Authors:

Min Shen, Zhi Ling Tang

Keywords:

Cadmium Zinc Telluride, Dark Current, Indium Contacts, Semiconductor Detector

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References

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