Application of Variable Precision Rough Set and Integrated Neural Network to Bearing Fault Diagnosis

Article Preview

Abstract:

The integration of variable precision rough set and neural network is introduced into the bearing fault diagnosis. VPRS-INN fault diagnosis method is proposed: First, utilize the information entropy method for discretization of continuous attributes, and then use attribute dependence degree of the variable precision rough set theory for heuristic reduction. based on the reduction, obtain the optimal decision support system. Finally according to the optimal design system, we design a integrated neural network for fault diagnosis. instances have proved the feasibility and high fault diagnosis rate of the method.

You might also be interested in these eBooks

Info:

Periodical:

Pages:

1060-1063

Citation:

Online since:

August 2013

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2013 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] Jian Lirong. Facing uncertain decision heterozygous rough set method and its application [M]. Beijing: Science Press, 2008: 43-44.

Google Scholar

[2] Nowicki R, Slowinski R, Stefanowski J. Evaluation of vibroacoustic diagnostic symptoms by means of the rough sets theory[J]. Computers in Industry, 1992, 20(2): 141-152.

DOI: 10.1016/0166-3615(92)90048-r

Google Scholar

[3] XIE Hong, CHENG Hao-Zhong, NIU Dong-Xiao. Discretization of Continuous Attributes in Rough Set Theory Based on Information Entropy.  Chinese Journal of Computers, 2005, 28(9): 1570-1573.

Google Scholar

[4] Aleksander hrn. ROSETTA Technical Reference Manual. Department of Computer and Information science , 2001: 21-28.

Google Scholar

[5] CHEN Xi, LEI Jian, FU Ming. Attribute reduction algorithm for rough set based on improving genetic algorithm[J]. Computer Engineering and Design, 2010, 31(3): 602-608.

Google Scholar

[6] Freescale technology R & D center. Neural network theory and the realization of MATLAB7 [M]. Beijing: Publishing House of electronics industry, 2005: 100-104.

Google Scholar