Efficient and Accurate Testing of On-Chip ADC Based on ATE

Abstract:

The embedded digital-analog mixed-signal circuit testing has become one of the difficulties to be solved. In this paper, a SoC embedded ADC has been tested based on the Credence Gemini500 verification system. The testing method is studied and verified through the test experiment and results. This testing method is an important reference for general embedded IP core testing.

• Periodical: Applied Mechanics and Materials (Volumes 380-384)
• Pages: 3378-3381
• DOI: https://doi.org/10.4028/www.scientific.net/AMM.380-384.3378
• Online since: August 2013
• Authors: Shu Hua Wei, Lan Dai, Xiao Bo Zhang, Yan Feng Jiang
• Keywords: ADC Testing, ATE, Mixed-Signal, SoC

References

[1] Y. Zorian, E.J. Marinissen, S Dey: IEEE Int Test Conf, Washington D C, USA, (1998), p.130.

[2] D. Zhao, S. Upadhyaya: IEEE Trans. on Computer-aided design of integrated circuits and systems. Vol. 24, (2005), p.956.

[3] M. Nahvi, A. Ivanov: IEEE Trans. on Computer-aided design of integrated circuits and systems. Vol. 23, (2004), p.1128.

DOI: 10.1109/tcad.2004.829796

[4] T. C. Hofner: Microwaves & RF. (2000) p.75.

[5] N. Giaquinto, A. Trotta: IEEE Trans. on Instrum and Meas. Vol. 46, (1997), p.1020.

[6] F. Adamo, F. Attivissimo, N. Giaquinto and M. Savino: IEEE Trans. on Instrum and Meas. Vol. 51, (2002), p.1050.

DOI: 10.1109/tim.2002.807795

[7] D.K. Mishra: Int. J. Elect, Vol. 90, (2003), p.459.

[8] A.C. Serra, M.F. da Silva, P.M. Ramos and R.C. Martins: IEEE Trans. on Instrum and Meas. Vol. 54, (2005), p.1617.