Influence of Cu Doping on the Thermoelectric Properties of Bi1.5Pb0.5Sr1.8La0.2Co2Oy

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Abstract:

Cu doped Bi1.5Pb0.5Sr1.8La0.2Co2-xCuxOy (x = 0.0, 0.2, 0.4) samples were prepared through the solid state reaction method. The influence of different Cu doping contents on electrical resistivity, Seebeck coefficients, thermal conductivity, and the dimensionless figure of merit ZT was investigated. All the samples of Cu concentration 0.4 are single phases. The electrical resistivity of Bi1.5Pb0.5Sr1.8La0.2Co1.8Cu0.2Oy descends, and its ZT values are enhanced obviously. The results show that suitable element doping can modify the electric transport properties and enhance thermoelectric properties of materials.

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593-596

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September 2013

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© 2013 Trans Tech Publications Ltd. All Rights Reserved

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[1] I. Terasaki, Y. Sasago and K. Uchinokura: Phys. Rev. B Vol. 56 (1997), p. R12685.

Google Scholar

[2] G. Peleckis, T. Motohashi, M. Karppinen and H. Yamauchi: Appl. Phys. Lett. Vol. 83 (2003), p.5416.

Google Scholar

[3] S. Tajima, T. Tani, S. Isobe and K. Koumoto: Mater. Sci. Eng. B Vol. 86 (2001), p.20.

Google Scholar

[4] H.S. Hao, Q.L. He, C.Q. Chen and X. Hu: Int. J. Mod. Phy. B Vol. 23 (2009), p.87.

Google Scholar

[5] H.S. Hao, L.M. Zhao and X. Hu: J. Mater. Sci. Technol. Vol. 25 (2009), p.105.

Google Scholar

[6] L.M. Zhao and T. Zhu: J. Synth. Cryst. Vol. 39 (2010), p.470.

Google Scholar

[7] R. Funahashi and M. Shikano: Appl. Phys. Lett. Vol. (2002), p.1459.

Google Scholar

[8] R. Funahashi, I. Matsubara and S. Sodeoka: Appl. Phys. Lett. Vol. 76 (2000), p.2385.

Google Scholar

[9] G. Xu, R. Funahashi, M. Shikano, I. Matsubara and Y. Zhou: J. Appl. Phys. Vol. 91 (2002), p.4344.

Google Scholar

[10] Z.H. Li, G. Chen, J. Pei and P.S. Liu: Chin. J. Inorg. Chem. Vol. 24 (2008), p.926.

Google Scholar

[11] M. Ito, T. Nagira and S. Hara: J. Alloy Compd. Vol. 408-412 (2006), p.1217.

Google Scholar

[12] K. Park and K.U. Jang: Mater. Lett. Vol. 60 (2006), p.1106.

Google Scholar

[13] I. Terasaki, I. Tsukada and Y. Iguchi: Phys. Rev. B Vol. 65 (2002), p.195106.

Google Scholar

[14] K. Park, K.Y. Ko, J. Kim and W.S. Cho: Mater. Sci. Eng. B Vol. 129 (2006), p.200.

Google Scholar

[15] G. Xu, R. Funahashi, M. Shikano, I. Matsubara and Y. Zhou: Appl. Phys. Lett. Vol. 80 (2002), p.3760.

Google Scholar

[16] H.S. Hao, S.F. Li, L.M. Zhao and X. Hu: Int. J. Mod. Phys. B Vol. 23 (2009), p.3777.

Google Scholar

[17] D.L. Wang, L.D. Chen, Q. Yao and J. Li: Solid State Commun. Vol. 129 (2004), p.615.

Google Scholar

[18] Q. Yao, D.L. Wang, L.D. Chen, X. Shi and M. Zhou: J. Appl. Phys. Vol. 97 (2005), p.103905.

Google Scholar