A Novel Fast Recovery Diode with Lower Emitter Efficiency

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In this paper, a new structure of Fast Recovery Diode (FRD) and its manufacture methods were investigated. The active region designed by TCAD simulation software could achieve low emitter injection efficiency, and then reduce the peak reverse recovery current, improve the reverse recovery softness and increase working stability. Meanwhile, the effect of the P-body dose and carrier lifetime on the turn-off characteristic of FRD was also discussed. Taking an example of 3300V voltage grade devices for FRD, the reasonable P-body dose and carrier lifetime on the basis of the new structure were confirmed by simulations. This diode was suitable for the anti-parallel with power switch device (such as IGBT, GTO, etc.).

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2222-2226

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October 2013

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© 2013 Trans Tech Publications Ltd. All Rights Reserved

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[1] Jan Vobecký : Design and Technology of High-Power Silicon Devices. MIXDES 2011, 18th International Conference Mixed Design of Integrated Circuits and Systems, June 16-18, (2011) 17-22.

Google Scholar

[2] J. VobeckyJ: Future Trends in High Power Devices. PROC. 27th INTERNATIONAL CONFERENCE ON MICROELECTRONICS (MIEL 2010), NIŠ, SERBIA, 16-19 MAY, (2010) 67-72.

Google Scholar

[3] M.T. Rahimo, N.Y.A. Shammas: Freewheeling DiodeReverse Recovery Failure Modes in IGBT Applications. IEEE Transactions on Industrial Application, Vol. 37, No. 2, March/April (2001) 661-670.

DOI: 10.1109/28.913734

Google Scholar

[4] H. P. Felsl, M. Pfaffenlehner: The CIBH Diode – Great Improvement for Ruggedness and Softness of High Voltage Diodes. Proceedings of the 20th International Symposium on Power Semiconductor Devices & IC's. May 18-22, (2008)173-176.

DOI: 10.1109/ispsd.2008.4538926

Google Scholar

[5] B. Heinze, H. P. Felsl: Influence of Buffer Structures on Static and Dynamic Ruggedness of High Voltage FWDs. Proceeding of the 17th International Symposium on Power Semiconductor Devices& IC's. May 23-26, (2005)215-218.

DOI: 10.1109/ispsd.2005.1487989

Google Scholar

[6] B. JAYANT BALIGA, in: MODERN POWER DEVICES , edtied by Wiley - Interscience Publication, (1987), in press.

Google Scholar

[7] Y. Onozawa, K. Takahashi, H. Nakano: Development of the 1200V FZ-diode with soft recovery characteristics by the new local lifetime control technique. Proceedings of the 20th International Symposium on Power Semiconductor Devices & IC's May 18-22, ( 2008) 80-83.

DOI: 10.1109/ispsd.2008.4538902

Google Scholar