Development of Power Semiconductor Devices DC Parameters Test Instrument

Abstract:

Power semiconductor devices are widely used and its DC parameters test equipment are in great demand. This paper broke through the key technology of high pulsed current generating based on charging and discharging with the capacitor. High voltage source, big pulse current source, constant voltage source that can test large current constant, small current source, small voltage source, a digital voltmeter, etc important parts of a power semiconductor devices DC parameters test equipment have been developed. Also the measurement software for DC parameters testing of the power semiconductor devices has been developed. Based on above, power semiconductor equipments DC parameters test instrument have developed successfully.

• Periodical: Applied Mechanics and Materials (Volume 437)
• Pages: 485-490
• DOI: https://doi.org/10.4028/www.scientific.net/AMM.437.485
• Online since: October 2013
• Authors: Chong Liu*, Yu Feng Cao, Qi Li
• Keywords: Charging through Capacitance, Discharge through Capacitance, Measuring Software, Power Semiconductor, Test Instrument

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