Reliability Analysis on Competitive Failure Processes under Multiple Failure Modes

Abstract:

In this article, a new multiple competing failure models proposed, in which multiple degradation processes and random shocks are considered. The shocks have a significant impact on system reliability, and the system reliability under not considering the impact of shocks is much higher than the impact of shocks is considered. In addition, the influences of the correlation among different degradation processes are also considered in this article. We can find that the reliability with considering the dependent case is higher than the independent case reliability. Thus the dependence of the two degradation processes is non-negligible. A numerical example with reliability analysis and sensitivity analysis is discussed to illustrate the proposed the new model.

• Periodical: Applied Mechanics and Materials (Volume 442)
• Pages: 257-263
• DOI: https://doi.org/10.4028/www.scientific.net/AMM.442.257
• Online since: October 2013
• Authors: Hui Bing Hao*, Chun Su
• Keywords: Multiple Dependent Degradation Processes, Random Shock, Reliability Analysis, Sensitivity Analysis

References

[1] Klutke G A, Yang Y. The availability of inspected systems subject to shocks and graceful degradation. IEEE Transactions on Reliability 2002; 51(3): 371-374.

DOI: 10.1109/tr.2002.802891

[2] Li W J, Pham H. Reliability modeling of multi-state degraded systems with multi-competing failures and random shocks. IEEE Transactions on Reliability 2005; 54(2): 297-303.

DOI: 10.1109/tr.2005.847278

[3] Li W J, Pham H. An inspection-maintenance model for systems with multiple competitive processes. IEEE Transactions on Reliability 2005; 54(2): 318-327.

DOI: 10.1109/tr.2005.847264

[4] Wang P. System reliability prediction based on degradation modeling considering field-operating stress scenarios. Ph.D. dissertation, Rutgers University, (2003).

[5] Sari J K, Newby M J, Berenguer C. Bivariate constant stress degradation model: LED lighting system reliability estimation with two-stage modeling. Quality and Reliability Engineering International 2009; 25(8): 1607-1084.

DOI: 10.1002/qre.1022

[6] Feng Q M, Coit D W. Reliability analysis for multiple dependent failure processes：an MEMS application. International Journal of Performability Engineering 2010; 6(1): 100-102.

[7] Peng H, Feng Q M, Coit D W. Reliability and maintenance modeling for systems subject to multiple dependent competing failure processes. IIE Transactions 2011; 43(1): 12-22.

DOI: 10.1080/0740817x.2010.491502

[8] Lu C J, Meeker W Q. Using degradation measures to estimate a time-to-failure distribution. Technometrics 1993; 35: 161-174.

DOI: 10.1080/00401706.1993.10485038

[9] Srikar V T, Senturia S D. The reliability of micro-electro mechanical Systems (MEMS) in shock environments. Journal of Micro-electro mechanical Systems 2002; 11: 206-214.

DOI: 10.1109/jmems.2002.1007399

[10] Tanner D M, Dugger M T. Wear mechanisms in a reliability methodology. Proceedings of the Society of Photo-ophical Instrumentation Engineers 2003; 4980: 22-40.