[1]
Amitava MitraL: Six sigma education: a critical role for academia. The TQM Magazine, Vol. 16 No. 4, (2004), pp.293-302.
DOI: 10.1108/09544780410541963
Google Scholar
[2]
Farhad Nabhani & Alireza Shokri: Reducing the delivery lead time in a food distribution SME through the implementation of six sigma methodology. Journal of Manufacturing Technology Management, Vol. 20 No. 7, (2009), pp.957-974.
DOI: 10.1108/17410380910984221
Google Scholar
[3]
Ahm Shamsuzzoha, Sami Kyllonen and Petri Helo: Collaborative customized product development framework, Industrial Management & Data Systems, Vol. 109 No. 5, (2009), pp.718-735.
DOI: 10.1108/02635570910957678
Google Scholar
[4]
Timothy Hogan, Jim Baker, Lisa Wesneski, Robert Black, Dave Rothenbury: Manufacturability: From Design to SPC Limits Through Corner-lot, Characterization, Proc. of SPIE, MEMS/MOEMS IV, Vol. 5716, pp.53-62.
DOI: 10.1117/12.591725
Google Scholar
[5]
Manas Bajaj, Russell Peak, Miyako Wilson, Injoong Kim, Thomas Thurman, M.C. Jothishanka, Mike Benda, Placid Ferreira, James Stori: Towards Next-Generation Design-for-Manufacturability (DFM) Frameworks for Electronics Product Realization. 2003 IEEUCPMTlSEMl iWI Electmniss Manufacturing TechnolDgy Symposium. (2003).
DOI: 10.1109/iemt.2003.1225930
Google Scholar
[6]
lochen Reitmeier, Kristin Paetzold. (2012).
Google Scholar
[7]
Chi-Min Yuan, Guy Assad, Bob Jarvis, Marc Olivaresa, Lionel Riviere Cazeau, Puneet Sharma, Jayathi Subramanian, Matt Thompson, Kevin Wu: Practical implementation of via and wire optimization at the SoC level. Proceeding of Conference on the Design for Manufacturability through Design-Process Integration III, (2009).
DOI: 10.1117/12.813396
Google Scholar
[8]
Haitham Eissa, Rami Fathy Salem, Ahmed Arafa, Sherif Hany, Abdelrahman El-Mously: Parametric DFM Solution for Analog Circuits: Electrical-Driven Hotspot Detection, Analysis, and Correction Flow. IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, Vol. 21 No. 5, (2013).
DOI: 10.1109/tvlsi.2012.2201759
Google Scholar
[9]
Jiajun Shao: New Thinking and Methodologies on Reliability Engineering, 8th International Conference on Reliability, Maintainability and Safety, (2009), pp.149-153.
DOI: 10.1109/icrms.2009.5270221
Google Scholar
[10]
R. Murat Tabanli, Tijen Ertay: Value stream mapping and benefit–cost analysis application for value visibility of a pilot project on RFID investment integrated to a manual production control system— a case study, Int J Adv Manuf Technol, Vol. 66, (2013).
DOI: 10.1007/s00170-012-4383-x
Google Scholar
[11]
David M. Ferrin, Martin J. Miller and David Muthler: Lean Sigma And Simulation, so What's the Correlation? V2. Proceedings of the 2005 Winter Simulation Conference, IEEE Press, (2005), p.2011-(2015).
DOI: 10.1109/wsc.2005.1574481
Google Scholar
[12]
Miltiadis Makrymichalos, Jiju Antony, Frenie Antony and Maneesh Kumar: Statistical thinking and its role for industrial engineers and managers in the 21st century. Managerial Auditing Journal, Vol. 20 No. 4, (2005), pp.354-363.
DOI: 10.1108/02686900510592043
Google Scholar
[13]
Yun-na Liu and Kang Li: Application of Six Sigma Methodology DMAIC in HR Project Management-A Case Study of Motorola SC HR DSS Project. 2011 IEEE 18th International Conference on Industrial Engineering and Engineering Management, (2011).
DOI: 10.1109/icieem.2011.6035403
Google Scholar
[14]
G. Cassanellia, G. Murab, F. Fantinia, M. Vanzib and B. Planoc: Failure Analysis-assisted FMEA. Microelectronics Reliabilityuality, vol. 46, (2006), p.1795–1799.
Google Scholar
[15]
S.M. Seyed-Hosseini, N. Safaei and M.J. Asgharpour: Reprioritization of failures in a system failure mode and effects analysis by decision making trial and evaluation laboratory technique. Reliability Engineering and System Safety, vol. 91, (2006).
DOI: 10.1016/j.ress.2005.09.005
Google Scholar
[16]
S. Chakraborti, S. Eryilmaz, S.W. Human: A phase II nonparametric control chart based on precedence statistics with runs-type signaling rules. Computational Statistics and Data Analysis, vol. 53, (2009), p.1054–1065.
DOI: 10.1016/j.csda.2008.09.025
Google Scholar