Patent Early-Warning Model Based on Visualization

Abstract:

Nowadays, patent early-warning becomes a hotspot with the increase of patent disputes events. Many methods have been developed to solve this problem especially patent map. Therefore, in order to facilitate patent analysis based on patent map, we proposed a visualization model of patent early-warning according to present researches and developed a prototype system in this paper. With the aid of computer and experts, users obtained more comprehensive and more precise results on both microcosmic and macroscopic levels.

• Periodical: Applied Mechanics and Materials (Volumes 513-517)
• Pages: 2722-2725
• DOI: https://doi.org/10.4028/www.scientific.net/AMM.513-517.2722
• Online since: February 2014
• Authors: Wei Tao You, Shi Chen*, Zhi Yuan Yang, Zhi Qiang Sun
• Keywords: Model, Patent Early-Warning, Patent Map, Visualization

References

[1] Paul F. Burke, Markus Reitzig. Measuring patent assessment quality—Analyzing the degree and kind of(in)consistency in patent offices' decision making[J], Research Policy, 2007, 36(9): 1404-1430.

DOI: 10.1016/j.respol.2007.06.003

[2] Sang-Sung Park, Won-Gyo Jung, Young-Geun Shin, Dong-Sik Jang. A patent examining expert system using pattern recognition[J], Expert Systems with Applications, 2011, 38(4): 4302-4311.

DOI: 10.1016/j.eswa.2010.09.099

[3] Heini M. Järvenpää, Saku J. Mäkinen, Marko Seppänen. Patent and publishing activity sequence over a technology's life cycle[J], Technological Forecasting and Social Change, 2011, 78(2): 283-293.

DOI: 10.1016/j.techfore.2010.06.020

[4] Ying Liang, Fuyuan Xu. Research on Patent Strategies in Enterprise Competitive Intelligence [J], Information Studies: Theory & Application, 2010, 33(3): 84-86.

[5] Lixin Xia, Jun Wang. Research on the Enterprise Technical Crisis Prewarning Based on Competitive Intelligence [J], Information Studies: Theory & Application, 2009, 32(9): 68-71.

[6] Youling Huang, Jing Dai. Study on Evaluation of Enterprise Patent Forewarning Degree[J], Intellectual Property, 2005, 15(89): 27-30.

[7] Yan-Ru Li, Leuo-Hong Wang, Chao-Fu Hong. Extracting the significant-rare keywords for patent analysis[J], Expert Systems with Applications, 2009, 36(1): 5200-5204.

DOI: 10.1016/j.eswa.2008.06.131

[8] Martin G. Moehrle. Measures for textual patent similarities: a guided way to select appropriate approaches[J], Scientometrics, 2010, 85(1): 95-109.

DOI: 10.1007/s11192-010-0243-3

[9] Sungjoo Lee, Byungun Yoon, Yongtae Park. An approach to discovering new technology opportunities: Keyword-based patent map approach[J], Technovation, 2009, 29(6-7): 481-497.

DOI: 10.1016/j.technovation.2008.10.006

[10] Sungjoo Lee, Byungun Yoon, Changyong Lee, Jinwoo Park. Business planning based on technological capabilities: Patent analysis for technology-driven roadmapping[J], Technological Forecasting and Social Change, 2009, 76(6): 769-786.

DOI: 10.1016/j.techfore.2009.01.003

[11] Xianjin Zha, Minghong Chen. Study on Early Warning of Competitive Technical Intelligence Based on the Patent Map[J], Journal of Computers, 2010, 5(2): 274-281.

DOI: 10.4304/jcp.5.2.274-281

[12] Charles V, Trappey, Hsin-Ying Wu, Fataneh Taghaboni-Dutta, Amy J.C. Trappey. Using patent data for technology forecasting: China RFID patent analysis[J], Advanced Engineering Informatics, 2011, 25(1): 53-64.

DOI: 10.1016/j.aei.2010.05.007

[13] Son C, Suh Y, Jeon J, et al. Development of a GTM-based patent map for identifying patent vacuums[J]. Expert Systems with Applications, 2012, 39(3): 2489-2500.

DOI: 10.1016/j.eswa.2011.08.101

[14] Andrienko N, Andrienko G. A visual analytics framework for spatio-temporal analysis and modelling[J]. Data Mining and Knowledge Discovery, 2013: 1-29.

DOI: 10.1007/s10618-012-0285-7

[15] Jing Li. Corporate Patent Early Warning Mechanism: A Study Based on Indicators System [D], Chongqing: Chongqing University, (2009).