Analysis and Evaluation on NBTI-Induced Circuit Aging

Abstract:

Aging effects degrade circuit performance with time, inducing reliability problem. Accurate prediction of circuit aging can help designer determine the reasonable design margin, avoiding the over-design of the circuit. Based on the physical understanding of aging mechanism, an analysis framework is proposed to predict NBTI-induced circuit aging. The analysis framework starts at the worst case prediction, which assumes the extremely operational conditions. Then, the impacts of different workloads and logic topology of the circuit on the aging-induced degradation are incorporated into the analysis framework to make the predicted result be closer to the practical scenario. Experimental results demonstrate that the effectiveness of the proposed analysis framework.

• Periodical: Applied Mechanics and Materials (Volumes 513-517)
• Pages: 3976-3982
• DOI: https://doi.org/10.4028/www.scientific.net/AMM.513-517.3976
• Online since: February 2014
• Authors: Song Jin*, Yi Ran Huang
• Keywords: Circuit Aging, Duty Cycle, NBTI, Workload

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