A Method for Components' Damage Detection Based on Optoelectronics Imaging Technology

Jun Wang

doi:10.4028/www.scientific.net/AMM.513-517.4131

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 513-517A Method for Components' Damage Detection Based on...

A Method for Components' Damage Detection Based on Optoelectronics Imaging Technology

Abstract:

This paper puts forward a method for components' damage detection based on optoelectronics imaging technology. According to the collection principle of optoelectronics imaging system, using pixel gray scale difference approach, the method extracts pixel characteristics of the optoelectronics image, which is taken as data foundation of following damage detection. Edge pixel positioning method is adopted to calculate spatial location of optoelectronics data of the components' damaged area edge, thus enabling components damage detection. Experimental results show that the method can improve the accuracy of components optoelectronics damage detection and meets the needs of quality inspection in component production.

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Periodical:

Applied Mechanics and Materials (Volumes 513-517)

Pages:

4131-4134

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.513-517.4131

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Cite this paper

Online since:

February 2014

Authors:

Jun Wang*

Keywords:

Component, Damage Detection, Edge Pixels, Optoelectronics Imaging

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* - Corresponding Author

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