A High-Throughput Imaging Spectrometer Based on Over-Scanning

Abstract:

We present a novel high-throughput imaging spectrometer based on over-scanning. The traditional slit-based spectrometer cannot gather enough radiation while the source is too weak. A much wider slit is used to replace the narrow one in traditional spectrometer. Too much wide slit will cause overlapping between different wavelength lights. In order to reconstruct super-resolution spectrum of source, over-scanning is employed which is realized by high precision electromechanical device. Experiments show that the reconstructed spectrum achieved a much higher resolution than original data meanwhile the throughput has improved significantly.

• Periodical: Applied Mechanics and Materials (Volumes 519-520)
• Pages: 1247-1251
• DOI: https://doi.org/10.4028/www.scientific.net/AMM.519-520.1247
• Online since: February 2014
• Authors: Jiang Yue, Jing Han, Yi Zhang, Lian Fa Bai*
• Keywords: High-Throughput, Over-Scanning, Spectrometer, Super-Resolution

References

[1] Moses W J, Bowles J H, Lucke R L, Corson M R. Opt. Express, 20, (4), 4309 (2012).

[2] P. Jacquinot, Rep. Prog. Phys. 23, 267 (1960).

[3] Nathan Hagen, Robert T. Kester, Liang Gao, Tomasz S. Tkaczyk, Opt. Eng, 51, (11), 111702 (2012).

[4] E C Cull, M E Gehm, D J Brady, C. R. Hsieh, O. Momtahan, and A. Adibi, Appl. Opt. 46, 365 (2007).

DOI: 10.1364/ao.46.000365

[5] J. A. Decker, Appl. Opt. 10, 510 (1971).

[6] P. Hansen and J. Strong, Appl. Opt. 11, 502 (1972).

[7] Michael E. Gehm, Scott T. McCain, Nikos P. Pitsianis, David J. Brady, Prasant Potuluri, and Michael E. Sullivan, Appl. Opt. 45, 2965 (2006).

DOI: 10.1364/ao.45.002965

[8] David Kittle, Kerkil Choi, Ashwin Wagadarikar, and David J. Brady, Appl. Opt. 49, 6824 (2010).

[9] Chu-Yu Huang and Wei-Chih Wang, Opt. Lett. 37, 1559 (2012).

[10] Lucy, L. B, Astronomical Journal, 79, 745 (1974).

[11] W. Deng, W. Yin, and Y. Zhang, Group Sparse Optimization by Alternating Direction Method, Rice CAAM Report TR11, 06, (2011).