Distance-Scale Restricted SIFT Matching Method for Complicated Content & Different Scales Image Pairs

Article Preview

Abstract:

Scale invariant feature transform (SIFT) matching performance decreases greatly when images are in different scales with complicated content and wide-baseline. In this paper, we address this problem, and propose a simple method to improve SIFT matching. The proposed method restricts the matching searching area into much smaller and more likely region to improve matching performance. Experiments shows that the proposed method has saved up to 90% matching time and increased up to 4% in the accuracy, compared with SIFT and previously solutions which only improve the matching accuracy.

You might also be interested in these eBooks

Info:

Periodical:

Pages:

292-296

Citation:

Online since:

February 2014

Authors:

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2014 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

* - Corresponding Author

[1] Lowe, D.: Distinctive image features from scale invariant keypoints, Int. J. Comput. Vis., (2004), pp.91-110.

Google Scholar

[2] Lowe, D. G. Object recognition from local scale-invariant features, Int. Conf. on Computer Vision, (1999), pp.1150-1157.

Google Scholar

[3] L. Li, X. Long: LSIFT-an improved SIFT algorithm with a new matching method, in Proc. ICCASM, Taiyuan, China, Oct. (2010), pp.643-646.

DOI: 10.1109/iccasm.2010.5620607

Google Scholar

[4] Yi, Z., Zhiguo, C., and Yang, X.: Multi-spectral remote image registration based on SIFT, Electron. Lett., (2008), 44, (2), pp.107-108.

DOI: 10.1049/el:20082477

Google Scholar

[5] Alhwarin, F., Wang, C., Ristic-Durrant, D., and Graser, A.: Improved SIFT-features matching for object recognition, Visions of Computer Science – BCS International Academic Conf., Imperial College, London, UK, Sept. (2008), pp.179-190.

DOI: 10.14236/ewic/vocs2008.16

Google Scholar

[6] Bastanlar, Y., Temizel A. and Yardmc Y.: Improved SIFT matching for image pairs with scale difference, Electron. Lett., (2010), 46, (5), pp.346-348.

DOI: 10.1049/el.2010.2548

Google Scholar